Vasileios Tenentes

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Daniele RossiUniversity of Pisa, ItalyAdresse e-mail validée de unipi.it
Bashir M. Al-HashimiProfessor of Computer Engineering, King’s College LondonAdresse e-mail validée de kcl.ac.uk
S KhursheedLecturer (Assistant Professor), University of Liverpool, UKAdresse e-mail validée de liv.ac.uk
Xrysovalantis KavousianosUniversity of IoanninaAdresse e-mail validée de cs.uoi.gr
Emmanouil KalligerosAssistant Professor, Information and Communication Systems Engineering Dept., Univ. of the AegeanAdresse e-mail validée de aegean.gr
yang shengPhD of electronics engineering, University of SouthamptonAdresse e-mail validée de worldprogramming.com
Krishnendu ChakrabartyFulton Professor of Microelectronics, School of Electrical and Computer and Energy EngineeringAdresse e-mail validée de asu.edu
Tom J KazmierskiAssociate Professor, Southampton UniversityAdresse e-mail validée de ecs.soton.ac.uk
Shidhartha DasAMDAdresse e-mail validée de amd.com
Geoff V MerrettProfessor, University of Southampton | Head of Centre for IoT and Pervasive SystemsAdresse e-mail validée de ecs.soton.ac.uk
Christos ZoniosPhD candidate, Computer Science & Engineering, University of IoanninaAdresse e-mail validée de uoi.gr
Dr Basel HalakAssociate Professor,University of SouthamptonAdresse e-mail validée de ecs.soton.ac.uk
Steve GunnProfessor of Electronics and Computer Science, University of SouthamptonAdresse e-mail validée de ecs.soton.ac.uk
Athanasios XynosPhD Candidate, Computer Science & Engineering, University of IoanninaAdresse e-mail validée de uoi.gr
Milosch MeriacTechnology Innovation InstitueAdresse e-mail validée de meriac.com
Yiorgos TsiatouhasUniversity of IoanninaAdresse e-mail validée de cse.uoi.gr
Hussam AmrouchProfessor (W3), Technical University of Munich (TUM)Adresse e-mail validée de tum.de
Jörg HenkelProfessor of Computer Science, Karlsruhe Institute of TechnologyAdresse e-mail validée de kit.edu
Sudhakar ReddyDepartment of ECE, University of IowaAdresse e-mail validée de engineering.uiowa.edu

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Vasileios Tenentes

University of Ioannina

Adresse e-mail validée de arm.com

hardware security energy efficient computing VLSI design and test electronic design automation


Titre Trier par citations Trier par année Trier par titre	Citée par Citée par	Année
Sensitivity and evaluation of current fire risk and future projections due to climate change: the case study of Greece A Karali, M Hatzaki, C Giannakopoulos, A Roussos, G Xanthopoulos, ... Natural Hazards and Earth System Science 14 (1), 143-153, 2014	79	2014
Aging Benefits in Nanometer CMOS Designs D Rossi, V Tenentes, S Yang, S Khursheed, B Al-Hashimi IEEE Transactions on Circuits and Systems II: Express Briefs 64 (3), 324-328, 2017	39	2017
Reliable power gating with NBTI aging benefits D Rossi, V Tenentes, S Yang, S Khursheed, B Al-Hashimi IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1-10, 2016	31	2016
State skip LFSRs: Bridging the gap between test data compression and test set embedding for IP cores V Tenentes, X Kavousianos, E Kalligeros Proceedings of the conference on Design, automation and test in Europe, 474-479, 2008	30	2008
Single and variable-state-skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores V Tenentes, X Kavousianos, E Kalligeros IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2010	28	2010
Defect aware x-filling for low-power scan testing S Balatsouka, V Tenentes, X Kavousianos, K Chakrabarty 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010	25	2010
Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure V Tenentes, D Rossi, S Yang, S Khursheed, BM Al-Hashimi, SR Gunn IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2017	19	2017
BTI and leakage aware dynamic voltage scaling for reliable low power cache memories D Rossi, V Tenentes, S Khursheed, BM Al-Hashimi IEEE international on-Line testing symposium (IOLTS'15), 2015	19	2015
NBTI and leakage aware sleep transistor design for reliable and energy efficient power gating D Rossi, V Tenentes, S Khursheed, B Al-Hashimi 20th IEEE European Test Symposium (ETS 2015), 2015	19	2015
Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets X Kavousianos, V Tenentes, K Chakrabarty, E Kalligeros IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19 (12 …, 2011	18	2011
High-quality statistical test compression with narrow ATE interface V Tenentes, X Kavousianos IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2013	16	2013
Exploiting aging benefits for the design of reliable drowsy cache memories D Rossi, V Tenentes, SM Reddy, BM Al-Hashimi, A Brown IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2018	13	2018
BTI aware thermal management for reliable DVFS designs H Chahal, V Tenentes, D Rossi, BM Al-Hashimi 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2016	13	2016
High quality testing of grid style power gating V Tenentes, S Khursheed, BM Al-Hashimi, S Zhong, S Yang 2014 IEEE 23rd Asian Test Symposium, 186-191, 2014	10	2014
Sensitivity and evaluation of current fire risk and future projections due to climate change: the case study of Greece A Karali, M Hatzaki, C Giannakopoulos, A Roussos, G Xanthopoulos, ... Natural Hazards Earth Systems Science Discussion 1, 4777-4800, 2013	10	2013
Low power test-compression for high test-quality and low test-data volume V Tenentes, X Kavousianos 2011 Asian Test Symposium, 46-53, 2011	10	2011
Test-data volume and scan-power reduction with low ATE interface for multi-core SoCs V Tenentes, X Kavousianos 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 747-754, 2011	10	2011
Recycled IC detection through aging sensor D Rossi, V Tenentes, S Khursheed, SM Reddy 2018 IEEE 23rd European Test Symposium (ETS), 1-2, 2018	9	2018
The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology B Halak, V Tenentes, D Rossi Microelectronics Reliability 67, 74-81, 2016	8	2016
MeV ion event observed at 0950 UT on 4 May 1998 at a quasi‐perpendicular bow shock region: New observations and an alternative interpretation on its origin GC Anagnostopoulos, V Tenentes, ES Vassiliadis Journal of Geophysical Research: Space Physics 114 (A9), 2009	8	2009

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