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jerome boch
jerome boch
Adresse e-mail validée de umontpellier.fr
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Physical model for the low-dose-rate effect in bipolar devices
J Boch, F Saigné, RD Schrimpf, JR Vaille, L Dusseau, E Lorfevre
IEEE transactions on nuclear science 53 (6), 3655-3660, 2006
952006
Criterion for SEU occurrence in SRAM deduced from circuit and device simulations in case of neutron-induced SER
T Merelle, H Chabane, JM Palau, K Castellani-Coulie, F Wrobel, F Saigné, ...
IEEE transactions on nuclear science 52 (4), 1148-1155, 2005
842005
Dose rate effects in bipolar oxides: Competition between trap filling and recombination
J Boch, F Saigné, AD Touboul, S Ducret, JF Carlotti, M Bernard, ...
Applied physics letters 88 (23), 2006
702006
Total-dose and single-event effects in DC/DC converter control circuitry
PC Adell, RD Schrimpf, WT Holman, J Boch, J Stacey, P Ribero, ...
IEEE Transactions on Nuclear Science 50 (6), 1867-1872, 2003
682003
Estimation of low-dose-rate degradation on bipolar linear integrated circuits using switching experiments
J Boch, F Saigné, RD Schrimpf, JR Vaille, L Dusseau, S Ducret, ...
IEEE transactions on nuclear science 52 (6), 2616-2621, 2005
602005
Effect of switching from high to low dose rate on linear bipolar technology radiation response
J Boch, F Saigne, RD Schrimpf, DM Fleetwood, S Ducret, L Dusseau, ...
IEEE Transactions on Nuclear Science 51 (5), 2896-2902, 2004
522004
Temperature effect on heavy-ion induced parasitic current on SRAM by device simulation: Effect on SEU sensitivity
D Truyen, J Boch, B Sagnes, N Renaud, E Leduc, S Arnal, F Saigné
IEEE Transactions on Nuclear Science 54 (4), 1025-1029, 2007
472007
Prediction of multiple cell upset induced by heavy ions in a 90 nm bulk SRAM
V Correas, F Saigné, B Sagnes, F Wrobel, J Boch, G Gasiot, P Roche
IEEE Transactions on Nuclear Science 56 (4), 2050-2055, 2009
442009
Innovative simulations of heavy ion cross sections in 130 nm CMOS SRAM
V Correas, F Saigné, B Sagnes, J Boch, G Gasiot, D Giot, P Roche
IEEE Transactions on Nuclear Science 54 (6), 2413-2418, 2007
422007
The use of a dose-rate switching technique to characterize bipolar devices
JÉÔ Boch, YG Velo, FÉÉ Saigne, NJH Roche, RD Schrimpf, JR Vaille, ...
IEEE transactions on Nuclear Science 56 (6), 3347-3353, 2009
412009
Analysis of quasi-monoenergetic neutron and proton SEU cross sections for terrestrial applications
D Lambert, J Baggio, G Hubert, P Paillet, S Girard, V Ferlet-Cavrois, ...
IEEE transactions on nuclear science 53 (4), 1890-1896, 2006
402006
Neutron-induced SEU in SRAMs: Simulations with n-Si and nO interactions
D Lambert, J Baggio, G Hubert, V Ferlet-Cavrois, O Flament, F Saigné, ...
IEEE transactions on nuclear science 52 (6), 2332-2339, 2005
402005
Impact of total ionizing dose on the analog single event transient sensitivity of a linear bipolar integrated circuit
MF Bernard, L Dusseau, S Buchner, D McMorrow, R Ecoffet, J Boch, ...
IEEE Transactions on Nuclear Science 6 (54), 2534-2540, 2007
382007
Temperature effect on geminate recombination
J Boch, F Saigné, L Dusseau, RD Schrimpf
Applied physics letters 89 (4), 2006
372006
Elevated temperature irradiation at high dose rate of commercial linear bipolar ICs
J Boch, F Saigné, RD Schrimpf, DM Fleetwood, R Cizmarik, D Zander
IEEE Transactions on Nuclear Science 51 (5), 2903-2907, 2004
362004
ECORCE: A TCAD tool for total ionizing dose and single event effect modeling
A Michez, S Dhombres, J Boch
IEEE Transactions on Nuclear Science 62 (4), 1516-1527, 2015
322015
Thermal runaway in SiC Schottky barrier diodes caused by heavy ions
S Kuboyama, E Mizuta, Y Nakada, H Shindou, A Michez, J Boch, ...
IEEE Transactions on Nuclear Science 66 (7), 1688-1693, 2019
312019
Investigation and analysis of LM124 bipolar linear circuitry response phenomenon in pulsed X-ray environment
NJH Roche, L Dusseau, JR Vaillé, J Mekki, YG Velo, S Perez, J Boch, ...
IEEE Transactions on Nuclear Science 57 (6), 3392-3399, 2010
312010
Review and analysis of the radiation-induced degradation observed for the input bias current of linear integrated circuits
L Dusseau, M Bernard, J Boch, YG Velo, N Roche, E Lorfevre, F Bezerra, ...
IEEE Transactions on Nuclear Science 55 (6), 3174-3181, 2008
312008
Modeling and investigations on TID-ASETs synergistic effect in LM124 operational amplifier from three different manufacturers
F Roig, L Dusseau, A Khachatrian, NJH Roche, A Privat, JR Vaillé, J Boch, ...
IEEE Transactions on Nuclear Science 60 (6), 4430-4438, 2013
292013
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