Low-frequency noise analysis and modeling in vertical tunnel FETs with Ge source FS Neves, PGD Agopian, JA Martino, B Cretu, R Rooyackers, ...
IEEE Transactions on Electron Devices 63 (4), 1658-1665, 2016
72 2016 New method for parameter extraction in deep submicrometer MOSFETs C Mourrain, B Cretu, G Ghibaudo, P Cottin
ICMTS 2000. Proceedings of the 2000 International Conference on …, 2000
67 2000 Low temperature noise spectroscopy of 0.1 μm partially depleted silicon on insulator metal-oxide-semiconductor field effect transistors I Lartigau, JM Routoure, W Guo, B Cretu, R Carin, A Mercha, C Claeys, ...
Journal of applied physics 101 (10), 2007
57 2007 Low-Frequency Noise Assessment of Silicon Passivated Ge pMOSFETs With TiN/TaN/ W Guo, G Nicholas, B Kaczer, RM Todi, B De Jaeger, C Claeys, A Mercha, ...
IEEE electron device letters 28 (4), 288-291, 2007
47 2007 Low frequency noise characterization in n-channel FinFETs R Talmat, H Achour, B Cretu, JM Routoure, A Benfdila, R Carin, N Collaert, ...
Solid-state electronics 70, 20-26, 2012
41 2012 Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics SD Dos Santos, B Cretu, V Strobel, JM Routoure, R Carin, JA Martino, ...
Solid-state electronics 97, 14-22, 2014
36 2014 Impact of strain and source/drain engineering on the low frequency noise behaviour in n-channel tri-gate FinFETs W Guo, B Cretu, JM Routoure, R Carin, E Simoen, A Mercha, N Collaert, ...
Solid-State Electronics 52 (12), 1889-1894, 2008
33 2008 New ratio method for effective channel length and threshold voltage extraction in MOS transistors B Cretu, T Boutchacha, G Ghibaudo, F Balestra
Electronics Letters 37 (11), 717-719, 2001
33 2001 Determination of interface state distribution in polysilicon thin film transistors from low-frequency noise measurements: Application to analysis of electrical properties L Pichon, A Boukhenoufa, C Cordier, B Cretu
Journal of applied physics 100 (5), 2006
31 2006 Low frequency noise assessment in n-and p-channel sub-10 nm triple-gate FinFETs: Part I: Theory and methodology D Boudier, B Cretu, E Simoen, R Carin, A Veloso, N Collaert, A Thean
Solid-State Electronics 128, 102-108, 2017
30 2017 DC and low frequency noise performances of SOI p-FinFETs at very low temperature H Achour, R Talmat, B Cretu, JM Routoure, A Benfdila, R Carin, N Collaert, ...
Solid-state electronics 90, 160-165, 2013
30 2013 Detailed characterisation of Si gate-all-around nanowire MOSFETs at cryogenic temperatures D Boudier, B Cretu, E Simoen, A Veloso, N Collaert
Solid-State Electronics 143, 27-32, 2018
26 2018 Si/SiGe superlattice I/O FinFETs in a vertically-stacked gate-all-around horizontal nanowire technology G Hellings, H Mertens, A Subirats, E Simoen, T Schram, LA Ragnarsson, ...
2018 IEEE Symposium on VLSI Technology, 85-86, 2018
22 2018 Towards single‐trap spectroscopy: Generation‐recombination noise in UTBOX SOI nMOSFETs E Simoen, B Cretu, W Fang, M Aoulaiche, JM Routoure, R Carin, ...
physica status solidi (c) 12 (3), 292-298, 2015
22 2015 Low frequency noise assessment in n-and p-channel sub-10 nm triple-gate FinFETs: Part II: Measurements and results D Boudier, B Cretu, E Simoen, R Carin, A Veloso, N Collaert, A Thean
Solid-State Electronics 128, 109-114, 2017
20 2017 Low frequency noise analysis on Si/SiGe superlattice I/O n-channel FinFETs D Boudier, B Cretu, E Simoen, G Hellings, T Schram, H Mertens, D Linten
Solid-State Electronics 168, 107732, 2020
17 2020 Assessment of DC and low-frequency noise performances of triple-gate FinFETs at cryogenic temperatures B Cretu, D Boudier, E Simoen, A Veloso, N Collaert
Semiconductor Science and Technology 31 (12), 124006, 2016
16 2016 In depth static and low-frequency noise characterization of n-channel FinFETs on SOI substrates at cryogenic temperature H Achour, B Cretu, JM Routoure, R Carin, R Talmat, A Benfdila, E Simoen, ...
Solid-state electronics 98, 12-19, 2014
16 2014 Low-frequency noise studies on fully depleted UTBOX silicon-on-insulator nMOSFETs: challenges and opportunities E Simoen, M Aoulaiche, SD Dos Santos, JA Martino, V Strobel, B Cretu, ...
ECS Journal of Solid State Science and Technology 2 (11), Q205, 2013
15 2013 Thorough characterization of deep-submicron surface and buried channel pMOSFETs B Cretu, M Fadlallah, G Ghibaudo, J Jomaah, F Balestra, G Guégan
Solid-State Electronics 46 (7), 971-975, 2002
14 2002 