Sanz JM

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Leonardo SorianoProfessor in Applied PhysicsAdresse e-mail validée de uam.es
Pilar Prieto RecioUniversidad Autónoma de MadridAdresse e-mail validée de uam.es
Agustin R. Gonzalez-ElipeResearch Professor of CSIC at the Instituto de Ciencia de Mataeriales de SevillaAdresse e-mail validée de icmse.csic.es
Asuncion FernandezInstituto de Ciencias de Materiales de Sevilla, CSICAdresse e-mail validée de icmse.csic.es
Francisco YuberoTenured scientistAdresse e-mail validée de icmse.csic.es
Miguel AbbateDepartamento de Fisica, Universidade Federal do ParanaAdresse e-mail validée de fisica.ufpr.br
Francisco M Marquez LinaresFull Professor of Chemistry, University of Turabo-Universidad AGM, PR, USAAdresse e-mail validée de uagm.edu
Kleber Roberto PirotaProfessor, Instituto de Física Gleb Wataghin, Universidade Estadual de Campinas (Unicamp)Adresse e-mail validée de ifi.unicamp.br
Sven TougaardProfessor of physics, University of Southern DenmarkAdresse e-mail validée de sdu.dk
G. MunueraUniv Seville - SpainAdresse e-mail validée de us.es
Alejandro GutierrezProfessor of Applied Physics, Universidad Autonoma de MadridAdresse e-mail validée de uam.es
maurizio sacchiCNRS - Institut des NanoSciences de ParisAdresse e-mail validée de synchrotron-soleil.fr
J.F. MarcoInstituto de Química Física Blas CabreraAdresse e-mail validée de iqfr.csic.es
Marta ClementUniversidad Politécnica de Madrid. Grupo de Microsistemas y Materiales ElectrónicosAdresse e-mail validée de etsit.upm.es
JC Sanchez LopezInvestigador Científico CSIC, Instituto de Ciencia de Materiales de Sevilla (CSIC-US)Adresse e-mail validée de icmse.csic.es
Jan VogelCNRS senior research scientist, Institut Néel, GrenobleAdresse e-mail validée de neel.cnrs.fr
Jean Michel MartinUniversité de Lyon, Ecole Centrale de LyonAdresse e-mail validée de ec-lyon.fr
H A PadmoreLawrence Berkekely National LabAdresse e-mail validée de lbl.gov
Alfonso CaballeroUniversidad de SevillaAdresse e-mail validée de us.es
Anton P.J. StampflPhysicist, Australian Nuclear Science and Technology OrganisationAdresse e-mail validée de ansto.gov.au

Suivre

Sanz JM

retired Applied Physics Department Universidad Autónoma de Madrid

Adresse e-mail validée de uam.es

surface Analysis materials science coatings


Titre Trier par citations Trier par année Trier par titre	Citée par Citée par	Année
An XPS study of the interaction of oxygen with zirconium C Morant, JM Sanz, L Galan, L Soriano, F Rueda Surface Science 218 (2-3), 331-345, 1989	360	1989
Preferential sputtering of oxides: A comparison of model predictions with experimental data JB Malherbe, S Hofmann, JM Sanz Applied surface science 27 (3), 355-365, 1986	298	1986
Model for quantitative analysis of reflection-electron-energy-loss spectra: Angular dependence F Yubero, JM Sanz, B Ramskov, S Tougaard Physical Review B 53 (15), 9719, 1996	204	1996
An XPS study of the initial stages of oxidation of hafnium C Morant, L Galan, JM Sanz Surface and interface Analysis 16 (1‐12), 304-308, 1990	142	1990
Electron inelastic mean free path for Ti, TiC, TiN and TiO₂ as determined by quantitative reflection electron energy‐loss spectroscopy GG Fuentes, E Elizalde, F Yubero, JM Sanz Surface and Interface Analysis: An International Journal devoted to the …, 2002	137	2002
XPS characterization of nitrogen‐doped carbon nanotubes C Morant, J Andrey, P Prieto, D Mendiola, JM Sanz, E Elizalde physica status solidi (a) 203 (6), 1069-1075, 2006	134	2006
Compositional changes induced by 3.5 keV Ar+ ion bombardment in Ni-Ti oxide systems: A comparative study AR González-Elipe, G Munuera, JP Espinos, JM Sanz Surface Science 220 (2-3), 368-380, 1989	110	1989
Ar-ion bombardment effects on surfaces C Morant, JM Sanz, L Galan Physical Review B 45 (3), 1391, 1992	104	1992
Auger electron spectroscopy and X-ray photoelectron spectroscopy studies of the oxidation of polycrystalline tantalum and niobium at room temperature and low oxygen pressures JM Sanz, S Hofmann Journal of the Less Common Metals 92 (2), 317-327, 1983	103	1983
Dielectric loss function of Si and SiO₂ from quantitative analysis of REELS spectra F Yubero, S Tougaard, E Elizalde, JM Sanz Surface and interface analysis 20 (8), 719-726, 1993	99	1993
Low energy ion assisted film growth A Gonzalez-elipe, JM Sanz, F Yubero World Scientific, 2003	87	2003
The O 1s x-ray absorption spectra of transition-metal oxides: The TiO2− ZrO2− HfO2 and V2O5− Nb2O5− Ta2O5 series L Soriano, M Abbate, JC Fuggle, MA Jimenez, JM Sanz, C Mythen, ... Solid state communications 87 (8), 699-703, 1993	86	1993
Chemical changes induced by sputtering in TiO2 and some selected titanates as observed by X-ray absorption spectroscopy L Soriano, M Abbate, J Vogel, JC Fuggle, A Fernández, ... Surface science 290 (3), 427-435, 1993	84	1993
Quantitative evaluation of AES‐depth profiles of thin anodic oxide films (Ta₂O₅/Ta, Nb₂O₅/Nb) JM Sanz, S Hofmann Surface and interface analysis 5 (5), 210-216, 1983	79	1983
The statistical sputtering contribution to resolution in concentration-depth profiles MP Seah, JM Sanz, S Hofmann Thin Solid Films 81 (3), 239-246, 1981	76	1981
Electronic structure of stoichiometric and -bombarded determined by resonant photoemission C Morant, A Fernandez, AR Gonzalez-Elipe, L Soriano, A Stampfl, ... Physical Review B 52 (16), 11711, 1995	75	1995
The electronic structure of mesoscopic NiO particles L Soriano, M Abbate, J Vogel, JC Fuggle, A Fernández, ... Chemical physics letters 208 (5-6), 460-464, 1993	75	1993
Synthesis and characterization of monodisperse magnetite hollow microspheres M Francisco, C Teresa, C María, P Ramón, R Rolando, F Pedro, ... Soft Nanoscience Letters 2011, 2011	70	2011
Thermal oxidation of TiN studied by means of soft x‐ray absorption spectroscopy L Soriano, M Abbate, JC Fuggle, P Prieto, C Jiménez, JM Sanz, L Galán, ... Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 11 (1 …, 1993	70	1993
Electronic structure of insulating zirconium nitride P Prieto, L Galan, JM Sanz Physical Review B 47 (3), 1613, 1993	66	1993

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