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Slimane Oussalah, Ph.D
Slimane Oussalah, Ph.D
Adresse e-mail validée de cdta.dz
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A new oxide-trap based on charge pumping (OTCP) extraction method for irradiated MOSFET devices: part II (low frequencies)
B Djezzar, A Smatti, S Oussalah
Nuclear Science, IEEE Transactions on 51 (4), 1732-1736, 2004
522004
Oxide-trap based on charge pumping (OTCP) extraction method for irradiated MOSFET Devices: Part I (High frequencies)
B Djezzar, S Oussalah, A Smatti
Nuclear Science Symposium Conference Record (NSS), 2003 IEEE, 424-428, 2003
522003
A new oxide-trap based on charge-pumping (OTCP) extraction method for irradiated MOSFET devices: Part I (high frequencies)
B Djezzar, S Oussalah, A Smatti
Nuclear Science, IEEE Transactions on 51 (4), 1724-1731, 2004
412004
Oxide-trap based on charge pumping (OTCP) extraction method for irradiated MOSFET devices: Part II (low frequencies)
B Djezzar, A Smatti, S Oussalah
Nuclear Science Symposium Conference Record (NSS), 2003 IEEE, 601-605, 2003
312003
Characterisation of temperature dependent parameters of multi-quantum well (MQW) Ti/Au/n-AlGaAs/n-GaAs/n-AlGaAs Schottky diodes
W Filali, N Sengouga, S Oussalah, RH Mari, D Jameel, NA Al Saqri, ...
Superlattices and Microstructures 111, 1010-1021, 2017
302017
Investigation of the effects of thermal annealing on the structural, morphological and optical properties of nanostructured Mn doped ZnO thin films
F Lekoui, R Amrani, W Filali, E Garoudja, L Sebih, IE Bakouk, H Akkari, ...
Optical Materials 118, 111236, 2021
252021
A comparative study of different contact resistance test structures dedicated to the power process technology
S Oussalah, B Djezzar, R Jerisian
Solid-state electronics 49 (10), 1617-1622, 2005
232005
On the oxide thickness dependence of the time-dependent-dielectric-breakdown
S Oussalah, F Nebel
Electron Devices Meeting (HKEDM), 1999 IEEE Hong Kong, 42-45, 1999
211999
Field acceleration model for TDDB: still a valid tool to study the reliability of thick SiO2 based dielectric layers?
S Oussalah, B Djezzar
Electron Devices, IEEE Transactions on 54 (7), 1713-1717, 2007
16*2007
Analysis of I–VT characteristics of Be-doped AlGaAs Schottky diodes grown on (100) GaAs substrates by molecular beam epitaxy
S Oussalah, W Filali, E Garoudja, B Zatout, F Lekoui, R Amrani, ...
Microelectronics Journal 122, 105409, 2022
122022
Simulation of Ion Implantation for CMOS 1µm Using SILVACO Tools
M Boubaaya, FH Larbi, S Oussalah
Microelectronics (ICM), 2012 IEEE 24th International Conference on, 1-4, 2012
102012
Pixel sensor guard-ring geometry optimization by TCAD simulation
F Larbi, S Oussalah, N Belkhelfa, A Lounis
Microelectronics (ICM), 2014 IEEE 26th International Conference on, 29-31, 2014
92014
Artificial bee colony algorithm: a novel strategy for optical constants and thin film thickness extraction using only optical transmittance spectra for photovoltaic applications
E Garoudja, R Amrani, W Filali, F Lekoui, S Oussalah, Y Cuminal, ...
Optik 241, 167030, 2021
82021
Program for the optimization of an OTA for front end electronics based on multi objective genetic algorithms
A Dendouga, S Oussalah, D Thienpont, A Lounis
Microelectronics (MIEL), 2014 IEEE 29th International Conference on, 443-446, 2014
82014
Multiobjective genetic algorithms program for the optimization of an OTA for front-end electronics
A Dendouga, S Oussalah, D Thienpont, A Lounis
Advances in Electrical Engineering 2014, 2014
82014
Automated MOS transistor degradation measurements based on LabVIEW
S Oussalah, B Djezzar
Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2007 IEEE …, 2007
82007
Comparison of electrical performances of two n-in-p detectors with different implant type of guard ring by TCAD simulation
M Mekheldi, S Oussalah, A Lounis, N Brihi
Results in Physics 6, 80-81, 2016
72016
Telescopic Op-Amp Optimization for MDAC Circuit Design
A Dendouga, S Oussalah
Electronics 20 (2), 55, 2016
62016
A Novel Parameter Identification Approach for C–V–T Characteristics of Multi-Quantum Wells Schottky Diode Using Ant Lion Optimizer
W Filali, E Garoudja, S Oussalah, M Mekheldi, N Sengouga, M Henini
Russian Microelectronics 48, 428-434, 2019
52019
Investigation of structural and electrical properties of ITO thin films and correlation to optical parameters extracted using novel method based on PSO algorithm
R Amrani, E Garoudja, F Lekoui, W Filali, H Neggaz, YA Djebeli, L Henni, ...
Bulletin of Materials Science 46 (1), 8, 2023
42023
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