| An analytical model of single-event transients in double-gate MOSFET for circuit simulation YM Aneesh, SR Sriram, KR Pasupathy, B Bindu IEEE Transactions on Electron Devices 66 (9), 3710-3717, 2019 | 18 | 2019 |
| Analytical model of hot carrier degradation in uniaxial strained triple-gate FinFET for circuit simulation SR Sriram, B Bindu Journal of Computational Electronics 17, 163-171, 2018 | 9 | 2018 |
| Impact of NBTI induced variations on delay locked loop multi-phase clock generator SR Sriram, B Bindu Microelectronics Reliability 60, 33-40, 2016 | 9 | 2016 |
| A physics-based 3-D potential and threshold voltage model for undoped triple-gate FinFET with interface trapped charges SR Sriram, B Bindu Journal of Computational Electronics 18, 37-45, 2019 | 8 | 2019 |
| A physics-based model for LER-induced threshold voltage variations in double-gate MOSFET SR Sriram, B Bindu Journal of Computational Electronics 19 (2), 622-630, 2020 | 6 | 2020 |
| Analytical model for RDF-induced threshold voltage fluctuations in double-gate MOSFET SR Sriram, B Bindu IEEE Transactions on Device and Materials Reliability 19 (2), 370-377, 2019 | 3 | 2019 |
| Study of Line Edge Roughness Induced Threshold Voltage Fluctuations in Double-Gate MOSFET SR Sriram, B Bindu 2018 15th IEEE India Council International Conference (INDICON), 1-5, 2018 | 2 | 2018 |
| Hot Carrier Reliability in 45 nm Strained Si/relaxed Si1−xGex CMOS Based SRAM Cell SR Sriram, B Bindu 2018 15th IEEE India Council International Conference (INDICON), 1-6, 2018 | 2 | 2018 |
| Analytical modeling of random discrete traps induced threshold voltage fluctuations in double-gate MOSFET with HfO2/SiO2 gate dielectric stack SR Sriram, B Bindu Microelectronics Reliability 99, 87-95, 2019 | 1 | 2019 |
| Detection of chronic lymphocytic leukemia using Deep Neural Eagle Perch Fuzzy Segmentation–A novel comparative approach A Ashwini, SR Sriram, JJJ Sheela Biomedical Signal Processing and Control 90, 105905, 2024 | | 2024 |
| IoT-Based Smart Sensors: The Key to Early Warning Systems and Rapid Response in Natural Disasters A Ashwini, S Sangeetha Predicting Natural Disasters With AI and Machine Learning, 202-223, 2024 | | 2024 |
| Artificial Intelligence's Impact on Thrust Manufacturing With Innovations and Advancements in Aerospace A Ashwini, SR Sriram, A Manisha, JM Prabhakar Industry Applications of Thrust Manufacturing: Convergence with Real-Time …, 2024 | | 2024 |
| Quadruple spherical tank systems with automatic level control applications using fuzzy deep neural sliding mode FOPID controller A Ashwini, SR Sriram Journal of Engineering Research, 2023 | | 2023 |
| Impact of NBTI induced variations on FinFET based Vernier delay line time to digital converter SR Sriram, B Bindu 2017 International Conference on Nextgen Electronic Technologies: Silicon to …, 2017 | | 2017 |
| NBTI Induced Variations in MCML and CMOS based Ring Oscillators SR Sriram, B Bindu International Workshop on Physics of Semiconductor Devices (IWPSD), 520, 2016 | | 2016 |
| Design of FinFET based frequency synthesizer S Tayenjam, SR Sriram, B Bindu 2015 Annual IEEE India Conference (INDICON), 1-5, 2015 | | 2015 |
Bindu BobyProfessor, Vellore Institute of Technology, ChennaiAdresse e-mail validée de vit.ac.in
