Roger H. French
Roger H. French
Kyocera Professor, Case Western Reserve University, Case School of Engineering, Materials Science
Verified email at case.edu - Homepage
Title
Cited by
Cited by
Year
Bulk electronic structure of Experiment and theory
K Van Benthem, C Elsässer, RH French
Journal of applied physics 90 (12), 6156-6164, 2001
8632001
Electronic Band Structure of Al2O3, with Comparison to Alon and AIN
RH French
Journal of the American Ceramic Society 73 (3), 477-489, 1990
5421990
Experimental and theoretical determination of the electronic structure and optical properties of three phases of ZrO\textsubscript{2}
RH French, SJ Glass, FS Ohuchi, YN Xu, WY Ching
Physical Review B 49 (8), 5133, 1994
5411994
Vibrational spectroscopy of aluminum nitride
LE McNeil, M Grimsditch, RH French
Journal of the American Ceramic Society 76 (5), 1132-1136, 1993
4661993
Long range interactions in nanoscale science
RH French, VA Parsegian, R Podgornik, RF Rajter, A Jagota, J Luo, ...
Reviews of Modern Physics 82 (2), 1887, 2010
3572010
Origins and applications of London dispersion forces and Hamaker constants in ceramics
RH French
Journal of the American Ceramic Society 83 (9), 2117-2146, 2000
3182000
Comparisons of Hamaker constants for ceramic systems with intervening vacuum or water: From force laws and physical properties
HD Ackler, RH French, YM Chiang
Journal of Colloid and Interface Science 179 (2), 460-469, 1996
3001996
Parametric tip model and force–distance relation for Hamaker constant determination from atomic force microscopy
C Argento, RH French
Journal of Applied Physics 80 (11), 6081-6090, 1996
2401996
Method for providing nano-structures of uniform length
RH French, T Gierke, MA Harmer, A Jagota, SR Lustig, RH Mehta, ...
US Patent 6,998,358, 2006
2392006
Optical properties of aluminum oxide: determined from vacuum ultraviolet and electron energy‐loss spectroscopies
RH French, H Müllejans, DJ Jones
Journal of the American Ceramic Society 81 (10), 2549-2557, 1998
2211998
Method For Providing Nano-structures Of Uniform Length
R French, T Gierke, M Harmer, P Hietpas, A Jagota, S Lustig, R Mehta, ...
WO Patent 2,003,086,961, 2003
1792003
Thin glass film between ultrafine conductor particles in thick‐film resistors
YM Chiang, LA Silverman, RH French, RM Cannon
Journal of the American Ceramic Society 77 (5), 1143-1152, 1994
1711994
Temperature dependence of the electronic structure of oxides: MgO, MgAl\textsubscript{2}O\textsubscript{4} and Al\textsubscript{2}O\textsubscript{3}
ML Bortz, RH French, DJ Jones, RV Kasowski, FS Ohuchi
Physica Scripta 41 (4), 537, 1990
1491990
Full spectral calculation of non-retarded Hamaker constants for ceramic systems from interband transition strengths
RH French, RM Cannon, LK DeNoyer, YM Chiang
Solid State Ionics 75, 13-33, 1995
1471995
Electronic structure of β-BaB\textsubscript{2}O\textsubscript{4} and LiB\textsubscript{3}O\textsubscript{5} nonlinear optical crystals
RH French, JW Ling, FS Ohuchi, CT Chen
Physical Review B 44 (16), 8496, 1991
147*1991
Optical properties of Teflon® AF amorphous fluoropolymers
MK Yang, RH French, EW Tokarsky
Journal of Micro/Nanolithography, MEMS, and MOEMS 7 (3), 033010, 2008
1432008
Optical reflectivity measurements using a laser plasma light source
ML Bortz, RH French
Applied Physics Letters 55 (19), 1955-1957, 1989
1121989
Multiple scattering from rutile TiO2 particles
LE McNeil, RH French
Acta materialia 48 (18-19), 4571-4576, 2000
1092000
Optical properties and London dispersion interaction of amorphous and crystalline SiO\textsubscript{2} determined by vacuum ultraviolet
GL Tan, MF Lemon, DJ Jones, RH French
Physical Review-Section B-Condensed Matter 72 (20), 205117-205117, 2005
104*2005
Immersion Lithography: Photomask and Wafer-level Materials
RH French, HV Tran
Annual Review of Materials Research 39, 93-126, 2009
1032009
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Articles 1–20