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Emmanuel CADEL
Emmanuel CADEL
Groupe de Physique des Matériaux UMR CNRS 6634
Adresse e-mail validée de univ-rouen.fr - Page d'accueil
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Three-dimensional atomic-scale imaging of impurity segregation to line defects
D Blavette, E Cadel, A Fraczkiewicz, A Menand
Science 286 (5448), 2317-2319, 1999
3481999
Nanometre-scale evidence for interfacial dissolution–reprecipitation control of silicate glass corrosion
R Hellmann, S Cotte, E Cadel, S Malladi, LS Karlsson, S Lozano-Perez, ...
Nature materials 14 (3), 307-311, 2015
2742015
Gibbs-Thomson and diffusion-induced contributions to the growth rate of Si, InP, and GaAs nanowires
VG Dubrovskii, NV Sibirev, GE Cirlin, IP Soshnikov, WH Chen, R Larde, ...
Physical Review B 79 (20), 205316, 2009
2452009
Phosphorus segregation in nanocrystalline Ni–3.6 at.% P alloy investigated with the tomographic atom probe (TAP)
B Färber, E Cadel, A Menand, G Schmitz, R Kirchheim
Acta materialia 48 (3), 789-796, 2000
2232000
The role of the atom probe in the study of nickel-based superalloys
D Blavette, E Cadel, B Deconihout
Materials Characterization 44 (1-2), 133-157, 2000
1442000
Stability of nanometer-sized oxide clusters in mechanically-alloyed steel under ion-induced displacement cascade damage conditions
P Pareige, MK Miller, RE Stoller, DT Hoelzer, E Cadel, B Radiguet
Journal of Nuclear Materials 360 (2), 136-142, 2007
1362007
Phase transformation and segregation to lattice defects in Ni-base superalloys
D Blavette, E Cadel, C Pareige, B Deconihout, P Caron
Microscopy and microanalysis 13 (6), 464-483, 2007
1112007
Atom-probe tomography, TEM and ToF-SIMS study of borosilicate glass alteration rim: a multiscale approach to investigating rate-limiting mechanisms
S Gin, P Jollivet, GB Rossa, M Tribet, S Mougnaud, M Collin, M Fournier, ...
Geochimica et Cosmochimica Acta 202, 57-76, 2017
1062017
The spatial resolution of 3D atom probe in the investigation of single-phase materials
F Vurpillot, A Bostel, E Cadel, D Blavette
Ultramicroscopy 84 (3-4), 213-224, 2000
1022000
Atom probe study of sodium distribution in polycrystalline Cu (In, Ga) Se2 thin film
E Cadel, N Barreau, J Kessler, P Pareige
Acta Materialia 58 (7), 2634-2637, 2010
1012010
Atom probe tomography investigation of the microstructure of superalloys N18
E Cadel, D Lemarchand, S Chambreland, D Blavette
Acta materialia 50 (5), 957-966, 2002
962002
Depth resolution function of the laser assisted tomographic atom probe in the investigation of semiconductors
E Cadel, F Vurpillot, R Lardé, S Duguay, B Deconihout
Journal of Applied Physics 106 (4), 2009
902009
Rubidium distribution at atomic scale in high efficient Cu (In, Ga) Se2 thin-film solar cells
A Vilalta-Clemente, M Raghuwanshi, S Duguay, C Castro, E Cadel, ...
Applied Physics Letters 112 (10), 2018
762018
3D analysis of advanced nano-devices using electron and atom probe tomography
A Grenier, S Duguay, JP Barnes, R Serra, G Haberfehlner, D Cooper, ...
Ultramicroscopy 136, 185-192, 2014
682014
Snowplow effect and reactive diffusion in the Pt doped Ni–Si system
O Cojocaru-Mirédin, D Mangelinck, K Hoummada, E Cadel, D Blavette, ...
Scripta materialia 57 (5), 373-376, 2007
662007
First stages of the formation of Ni silicide by atom probe tomography
K Hoummada, E Cadel, D Mangelinck, C Perrin-Pellegrino, D Blavette, ...
Applied physics letters 89 (18), 2006
542006
Influence of RbF post deposition treatment on heterojunction and grain boundaries in high efficient (21.1%) Cu (In, Ga) Se2 solar cells
M Raghuwanshi, A Vilalta-Clemente, C Castro, S Duguay, E Cadel, ...
Nano Energy 60, 103-110, 2019
492019
Investigation of grain-boundary structure-segregation relationship in an N18 nickel-based superalloy
D Lemarchand, E Cadel, S Chambreland, D Blavette
Philosophical Magazine A 82 (9), 1651-1669, 2002
472002
Atomic scale investigation of boron nanosegregation in Fe Al intermetallics
E Cadel, D Lemarchand, AS Gay, A Fraczkiewicz, D Blavette
Scripta materialia 41 (4), 421-426, 1999
461999
Growth of Si nanowires on micropillars for the study of their dopant distribution by atom probe tomography
T Xu, JP Nys, B Grandidier, D Stiévenard, Y Coffinier, R Boukherroub, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2008
442008
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