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Emanuele Valea
Emanuele Valea
Research Engineer, CEA-List
Verified email at cea.fr
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Year
A survey on security threats and countermeasures in IEEE test standards
E Valea, M Da Silva, G Di Natale, ML Flottes, B Rouzeyre
IEEE Design & Test 36 (3), 95-116, 2019
392019
Stream vs block ciphers for scan encryption
E Valea, M Da Silva, ML Flottes, G Di Natale, B Rouzeyre
Microelectronics Journal 86, 65-76, 2019
232019
A new secure stream cipher for scan chain encryption
M Da Silva, E Valea, ML Flottes, S Dupuis, G Di Natale, B Rouzeyre
2018 IEEE 3rd International Verification and Security Workshop (IVSW), 68-73, 2018
212018
Encryption-based secure JTAG
E Valea, M Da Silva, ML Flottes, G Di Natale, B Rouzeyre
2019 IEEE 22nd International Symposium on Design and Diagnostics of …, 2019
172019
Providing confidentiality and integrity in ultra low power iot devices
E Valea, M Da Silva, ML Flottes, G Di Natale, S Dupuis, B Rouzeyre
2019 14th International Conference on Design & Technology of Integrated …, 2019
162019
SI ECCS: SECure context saving for IoT devices
E Valea, M Da Silva, G Di Natale, ML Flottes, S Dupuis, B Rouzeyre
2018 13th international conference on design & technology of integrated …, 2018
152018
Post-quantum cryptography: Challenges and opportunities for robust and secure HW design
D Bellizia, N El Mrabet, AP Fournaris, S Pontié, F Regazzoni, ...
2021 IEEE International Symposium on Defect and fault tolerance in VLSI and …, 2021
142021
Correlation electromagnetic analysis on an FPGA implementation of CRYSTALS-Kyber
RC Rodriguez, F Bruguier, E Valea, P Benoit
2023 18th Conference on Ph. D Research in Microelectronics and Electronics …, 2023
122023
A secure scan controller for protecting logic locking
QL Nguyen, E Valea, ML Flottes, S Dupuis, B Rouzeyre
2020 IEEE 26th International Symposium on On-Line Testing and Robust System …, 2020
112020
Evaluating data encryption effects on the resilience of an artificial neural network
R Cantoro, NI Deligiannis, MS Reorda, M Traiola, E Valea
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2020
102020
Towards the integration of reliability and security mechanisms to enhance the fault resilience of neural networks
NI Deligiannis, R Cantoro, MS Reorda, M Traiola, E Valea
IEEE Access 9, 155998-156012, 2021
92021
A Comprehensive Approach to a Trusted Test Infrastructure
M Merandat, V Reynaud, E Valea, J Quevremont, N Valette, P Maistri, ...
2019 IEEE 4th International Verification and Security Workshop (IVSW), 43-48, 2019
82019
On the optimization of SBST test program compaction
R Cantora, E Sanchez, MS Reorda, G Squillero, E Valea
2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2017
62017
Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs
F Azaïs, S Bernard, M Comte, B Deveautour, S Dupuis, H El Badawi, ...
2020 IEEE 26th International Symposium on On-Line Testing and Robust System …, 2020
32020
Flexible and portable management of secure scan implementations exploiting p1687. 1 extensions
M Portolan, E Valea, P Maistri, G Di Natale
IEEE Design & Test 39 (3), 117-124, 2021
22021
Evaluating the code encryption effects on memory fault resilience
R Cantoro, NI Deligiannis, MS Reorda, M Traiola, E Valea
2020 IEEE Latin-American Test Symposium (LATS), 1-6, 2020
22020
Encryption of test data: which cipher is better?
M Da Silva, E Valea, ML Flottes, S Dupuis, G Di Natale, B Rouzeyre
2018 14th Conference on Ph. D. Research in Microelectronics and Electronics …, 2018
22018
IEEE 1838 compliant scan encryption and integrity for 2.5/3D ICs
J Suzano, A Chastand, E Valea, G Di Natale, A Philippe, F Abouzeid, ...
IEEE European Test Symposium, 2024
12024
Improving the Fault Resilience of Neural Network Applications Through Security Mechanisms
NI Deligiannis, R Cantoro, MS Reorda, M Traiola, E Valea
2022 52nd Annual IEEE/IFIP International Conference on Dependable Systems …, 2022
12022
Hardware accelerator for FIPS 202 hash functions in post-quantum ready SoCs
DS Crescenzo, RC Rodriguez, R Alidori, F Bruguier, E Valea, P Benoit, ...
2024 IEEE 30th International Symposium on On-Line Testing and Robust System …, 2024
2024
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