Celia López-Ongil
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Effects of the PPARγ agonist pioglitazone on lipoprotein metabolism in patients with type 2 diabetes mellitus
K Nagashima, C Lopez, D Donovan, C Ngai, N Fontanez, A Bensadoun, ...
The Journal of clinical investigation 115 (5), 1323-1332, 2005
Endogenous processes during long-term starvation in activated sludge performing enhanced biological phosphorus removal
C Lopez, MN Pons, E Morgenroth
Water research 40 (8), 1519-1530, 2006
Autonomous fault emulation: A new FPGA-based acceleration system for hardness evaluation
C Lopez-Ongil, M Garcia-Valderas, M Portela-Garcia, L Entrena
IEEE Transactions on Nuclear Science 54 (1), 252-261, 2007
Soft error sensitivity evaluation of microprocessors by multilevel emulation-based fault injection
L Entrena, M Garcia-Valderas, R Fernandez-Cardenal, A Lindoso, ...
IEEE Transactions on Computers 61 (3), 313-322, 2010
New techniques for speeding-up fault-injection campaigns
L Berrojo, I González, F Corno, MS Reorda, G Squillero, L Entrena, ...
Proceedings 2002 Design, Automation and Test in Europe Conference and …, 2002
Association of fenofibrate therapy with long-term cardiovascular risk in statin-treated patients with type 2 diabetes
MB Elam, HN Ginsberg, LC Lovato, M Corson, J Largay, LA Leiter, ...
JAMA cardiology 2 (4), 370-380, 2017
Evaluation of microscopic techniques (epifluorescence microscopy, CLSM, TPE-LSM) as a basis for the quantitative image analysis of activated sludge
C Lopez, MN Pons, E Morgenroth
Water research 39 (2-3), 456-468, 2005
A unified environment for fault injection at any design level based on emulation
C Lopez-Ongil, L Entrena, M Garcia-Valderas, M Portela, MA Aguirre, ...
IEEE Transactions on Nuclear Science 54 (4), 946-950, 2007
An industrial environment for high-level fault-tolerant structures insertion and validation
L Berrojo, F Corno, L Entrena, I González, C Lopez, MS Reorda, ...
Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), 229-236, 2002
Mitochondrial DNA error prophylaxis: assessing the causes of errors in the GEP’02–03 proficiency testing trial
A Salas, L Prieto, M Montesino, C Albarrán, E Arroyo, ...
Forensic science international 148 (2-3), 191-198, 2005
The 2000–2001 GEP–ISFG Collaborative Exercise on mtDNA: assessing the cause of unsuccessful mtDNA PCR amplification of hair shaft samples
L Prieto, M Montesino, A Salas, A Alonso, C Albarrán, S Álvarez, ...
Forensic science international 134 (1), 46-53, 2003
SET emulation considering electrical masking effects
L Entrena, MG Valderas, RF Cardenal, MP Garcia, CL Ongil
IEEE Transactions on Nuclear Science 56 (4), 2021-2025, 2009
Fault injection in modern microprocessors using on-chip debugging infrastructures
M Portela-Garcia, C Lopez-Ongil, MG Valderas, L Entrena
IEEE Transactions on Dependable and Secure Computing 8 (2), 308-314, 2010
A rapid fault injection approach for measuring seu sensitivity in complex processors
M Portela-Garcia, C Lopez-Ongil, M Garcia-Valderas, L Entrena
13th IEEE International On-Line Testing Symposium (IOLTS 2007), 101-106, 2007
Accurate and efficient analysis of single event transients in VLSI circuits
MS Reorda, M Violante
9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003., 101-105, 2003
On the use of embedded debug features for permanent and transient fault resilience in microprocessors
M Portela-García, M Grosso, M Gallardo-Campos, MS Reorda, L Entrena, ...
Microprocessors and Microsystems 36 (5), 334-343, 2012
Correlation-based fingerprint matching using FPGAs
A Lindoso, L Entrena, C López-Ongil, J Liu
Proceedings. 2005 IEEE International Conference on Field-Programmable …, 2005
Logic masking for SET mitigation using approximate logic circuits
A Sanchez-Clemente, L Entrena, M García-Valderas, C López-Ongil
2012 IEEE 18th International On-Line Testing Symposium (IOLTS), 176-181, 2012
Impacto social de la enfermedad de Alzheimer y otras demencias
C Prieto, M Eimil, C López de Silanes, M Llanero
Madrid: Fundación cerebro, 2011
Fault injection-based reliability evaluation of SoPCs
MS Reorda, L Sterpone, M Violante, M Portela-García, C López-Ongil, ...
Eleventh IEEE European Test Symposium (ETS'06), 75-82, 2006
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