| Challenges of using on-chip performance monitors for process and environmental variation compensation M Zandrahimi, Z Al-Ars, P Debaud, A Castillejo 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2016 | 12 | 2016 |
| Two effective methods to detect anomalies in embedded systems M Zandrahimi, HR Zarandi, MH Mottaghi Microelectronics Journal 43 (1), 77-87, 2012 | 11 | 2012 |
| A Survey on Low-Power Techniques for Single and Multicore Systems. M Zandrahimi, Z Al-Ars ICCASA, 69-74, 2014 | 10 | 2014 |
| Using transition fault test patterns for cost effective offline performance estimation M Zandrahimi, P Debaud, A Castillejo, Z Al-Ars 2017 12th International Conference on Design & Technology of Integrated …, 2017 | 4 | 2017 |
| An analysis of fault effects and propagations in ZPU: The world's smallest 32 bit CPU M Zandrahimi, HR Zarandi, A Rohani 2nd Asia Symposium on Quality Electronic Design (ASQED), 308-313, 2010 | 4 | 2010 |
| Industrial approaches for performance evaluation using on-chip monitors M Zandrahimi, P Debaud, A Castillejo, Z Al-Ars 2016 11th International Design & Test Symposium (IDT), 210-215, 2016 | 2 | 2016 |
| Industrial evaluation of transition fault testing for cost effective offline adaptive voltage scaling M Zandrahimi, P Debaud, A Castillejo, Z Al-Ars 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE), 289-292, 2018 | 1 | 2018 |
| Transition Fault Testing for Offline Adaptive Voltage Scaling M Zandrahimi, P Debaud, A Castillejo, Z Al-Ars ITC, 2017 | 1 | 2017 |
| A Probabilistic Method to Detect Anomalies in Embedded Systems M Zandrahimi, A Zarei, HR Zarandi 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI …, 2010 | 1 | 2010 |
| New Switch Box Architecture for SEU Detection in SRAM-Based FPGAs A Rohani, HR Zarandi, M Zandrahimi 2009 2nd International Conference on Computer Science and its Applications, 1-6, 2009 | 1 | 2009 |
| Evaluation of the Impact of Technology Scaling on Delay Testing for Low-Cost AVS M Zandrahimi, P Debaud, A Castillejo, Z Al-Ars Journal of Electronic Testing 35, 303-315, 2019 | | 2019 |
| Cost Effective Adaptive Voltage Scaling Using Path Delay Fault Testing M Zandrahimi, P Debaud, A Castillejo, Z Al-Ars 2018 IEEE East-West Design & Test Symposium (EWDTS), 1-6, 2018 | | 2018 |
| Cost Effective Adaptive Voltage Scaling Using Path Delay Fault Testing ACZAA Mahroo Zandrahimi, Philippe Debaud IEEE EAST-WEST DESIGN & TEST SYMPOSIUM, 2018 | | 2018 |
| An industrial case study of low cost adaptive voltage scaling using delay test patterns M Zandrahimi, P Debaud, A Castillejo, Z Al-Ars 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE), 999 …, 2018 | | 2018 |
| Low power IC design characterization techniques under process variations M Zandrahimi | | 2018 |
