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James K Gillespie
James K Gillespie
Senior Electronics Engineer AFRL
Adresse e-mail validée de us.af.mil
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Short-channel effect limitations on high-frequency operation of AlGaN/GaN HEMTs for T-gate devices
GH Jessen, RC Fitch, JK Gillespie, G Via, A Crespo, D Langley, ...
IEEE Transactions on Electron Devices 54 (10), 2589-2597, 2007
530*2007
AlGaN/GaN metal–oxide–semiconductor high electron mobility transistors using as the gate oxide and surface passivation
R Mehandru, B Luo, J Kim, F Ren, BP Gila, AH Onstine, CR Abernathy, ...
Applied physics letters 82 (15), 2530-2532, 2003
1752003
Wet chemical digital etching of GaAs at room temperature
GC DeSalvo, CA Bozada, JL Ebel, DC Look, JP Barrette, CLA Cerny, ...
Journal of The Electrochemical Society 143 (11), 3652, 1996
1501996
High-power Ka-band performance of AlInN/GaN HEMT with 9.8-nm-thin barrier
A Crespo, MM Bellot, KD Chabak, JK Gillespie, GH Jessen, V Miller, ...
IEEE Electron Device Letters 31 (1), 2-4, 2009
1222009
Full-wafer characterization of AlGaN/GaN HEMTs on free-standing CVD diamond substrates
KD Chabak, JK Gillespie, V Miller, A Crespo, J Roussos, M Trejo, ...
IEEE electron device letters 31 (2), 99-101, 2009
962009
Comparison of gate and drain current detection of hydrogen at room temperature with AlGaN∕ GaN high electron mobility transistors
HT Wang, BS Kang, F Ren, RC Fitch, JK Gillespie, N Moser, G Jessen, ...
Applied Physics Letters 87 (17), 2005
842005
Field effect transistor device with single layer integrated metal and retained semiconductor masking
CA Bozada, TK Quach, K Nakano, GC DeSalvo, GD Via, RW Dettmer, ...
US Patent 5,698,900, 1997
83*1997
ScAlN/GaN high-electron-mobility transistors with 2.4-A/mm current density and 0.67-S/mm transconductance
AJ Green, JK Gillespie, RC Fitch, DE Walker, M Lindquist, A Crespo, ...
IEEE Electron Device Letters 40 (7), 1056-1059, 2019
762019
Implementation of High-Power-Density-Band AlGaN/GaN High Electron Mobility Transistors in a Millimeter-Wave Monolithic Microwave Integrated Circuit Process
RC Fitch, DE Walker, AJ Green, SE Tetlak, JK Gillespie, RD Gilbert, ...
IEEE electron device letters 36 (10), 1004-1007, 2015
682015
High electron mobility transistor (HEMT) and pseudomorphic high electron mobility transistor (PHEMT) devices with single layer integrated metal
K Nakano, CA Bozada, TK Quach, GC DeSalvo, GD Via, RW Dettmer, ...
US Patent 5,698,870, 1997
68*1997
AlGaN/GaN HEMT on diamond technology demonstration
GH Jessen, JK Gillespie, GD Via, A Crespo, D Langley, J Wasserbauer, ...
2006 IEEE Compound Semiconductor Integrated Circuit Symposium, 271-274, 2006
652006
Effects of Sc2O3 and MgO passivation layers on the output power of AlGaN/GaN HEMTs
JK Gillespie, RC Fitch, J Sewell, R Dettmer, GD Via, A Crespo, TJ Jenkins, ...
IEEE Electron Device Letters 23 (9), 505-507, 2002
652002
RF Power Measurements of InAlN/GaN Unstrained HEMTs on SiC Substrates at 10 GHz
GH Jessen, JK Gillespie, GD Via, A Crespo, D Langley, ME Aumer, ...
IEEE electron device letters 28 (5), 354-356, 2007
592007
Electrical characteristics of proton-irradiated passivated AlGaN/GaN high electron mobility transistors
B Luo, J Kim, F Ren, JK Gillespie, RC Fitch, J Sewell, R Dettmer, GD Via, ...
Applied physics letters 82 (9), 1428-1430, 2003
552003
Comparison of surface passivation films for reduction of current collapse in AlGaN/GaN high electron mobility transistors
B Luo, R Mehandru, J Kim, F Ren, BP Gila, AH Onstine, CR Abernathy, ...
Journal of The Electrochemical Society 149 (11), G613, 2002
522002
Field effect transistor device with single layer integrated metal and retained semiconductor masking
CA Bozada, TK Quach, K Nakano, GC DeSalvo, GD Via, RW Dettmer, ...
US Patent 5,698,900, 1997
52*1997
Improved morphology for ohmic contacts to AlGaN/GaN high electron mobility transistors using - or W-based metallization
B Luo, F Ren, RC Fitch, JK Gillespie, T Jenkins, J Sewell, D Via, A Crespo, ...
Applied physics letters 82 (22), 3910-3912, 2003
502003
RF power performance of Sc (al, Ga) N/GaN HEMTs at Ka-band
AJ Green, N Moser, NC Miller, KJ Liddy, M Lindquist, M Elliot, JK Gillespie, ...
IEEE Electron Device Letters 41 (8), 1181-1184, 2020
492020
Dependence on proton energy of degradation of AlGaN/GaN high electron mobility transistors
L Liu, CF Lo, Y Xi, Y Wang, F Ren, SJ Pearton, HY Kim, J Kim, RC Fitch, ...
Journal of Vacuum Science & Technology B 31 (2), 2013
492013
Effective suppression of IV knee walk-out in AlGaN/GaN HEMTs for pulsed-IV pulsed-RF with a large signal network analyzer
SJ Doo, P Roblin, GH Jessen, RC Fitch, JK Gillespie, NA Moser, A Crespo, ...
IEEE Microwave and wireless components letters 16 (12), 681-683, 2006
422006
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