Study of short-circuit robustness of SiC MOSFETs, analysis of the failure modes and comparison with BJTs C Chen, D Labrousse, S Lefebvre, M Petit, C Buttay, H Morel
Microelectronics Reliability 55 (9-10), 1708-1713, 2015
87 2015 Challenges facing PFC of a single-phase on-board charger for electric vehicles based on a current source active rectifier input stage C Saber, D Labrousse, B Revol, A Gascher
IEEE Transactions on Power Electronics 31 (9), 6192-6202, 2015
65 2015 Self-starting DC: DC boost converter for low-power and low-voltage microbial electric generators N Degrenne, F Buret, F Morel, SE Adami, D Labrousse, B Allard, A Zaoui
2011 IEEE Energy Conversion Congress and Exposition, 889-896, 2011
50 2011 Robustness in short-circuit mode of SiC MOSFETs C Chen, D Labrousse, S Lefebvre, M Petit, C Buttay, H Morel
Proceedings of PCIM Europe 2015; International Exhibition and Conference for …, 2015
40 2015 Common-Mode Modeling of the Association of -Switching Cells: Application to an Electric-Vehicle-Drive System D Labrousse, B Revol, F Costa
IEEE Transactions on Power Electronics 25 (11), 2852-2859, 2010
35 2010 Comparison of 3 self-starting step-up DC: DC converter topologies for harvesting energy from low-voltage and low-power microbial fuel cells N Degrenne, B Allard, F Buret, F Morel, SE Adami, D Labrousse
Proceedings of the 2011 14th European Conference on Power Electronics and …, 2011
34 2011 [131] experimental study of the short-circuit robustness of 600 V E-mode GaN transistors M Landel, C Gautier, D Labrousse, S Lefebvre
Microelectronics Reliability 64, 560-565, 2016
31 2016 Using laminated metal foam as the top-side contact of a PCB-embedded power die Y Pascal, A Abdedaim, D Labrousse, M Petit, S Lefebvre, F Costa
IEEE Electron Device Letters 38 (10), 1453-1456, 2017
30 2017 A 140 mV self-starting 10 mW DC/DC converter for powering low-power electronic devices from low-voltage microbial fuel cells N Degrenne, B Allard, F Buret, SE Adami, D Labrousse, C Vollaire, ...
Journal of Low Power Electronics 8 (4), 485-497, 2012
22 2012 Dispersion of electrical characteristics and short-circuit robustness of 600 V emode GaN transistors M Landel, C Gautier, D Labrousse, S Levebvre, F Zaki, Z Khatir
PCIM Europe 2017; International Exhibition and Conference for Power …, 2017
19 2017 Thermal management for GaN power devices mounted on PCB substrates S Zhang, E Laboure, D Labrousse, S Lefebvre
2017 IEEE International Workshop On Integrated Power Packaging (IWIPP), 1-5, 2017
17 2017 Estimating current distributions in power semiconductor dies under aging conditions: Bond wire liftoff and aluminum reconstruction TA Nguyen, S Lefebvre, PY Joubert, D Labrousse, S Bontemps
IEEE Transactions on Components, Packaging and Manufacturing Technology 5 (4 …, 2015
17 2015 SiC MOSFETs robustness for diode-less applications O Avino-Salvado, C Cheng, C Buttay, H Morel, D Labrousse, S Lefebvre, ...
EPE Journal 28 (3), 128-135, 2018
15 2018 PCB-embedding of power dies using pressed metal foam Y Pascal, D Labrousse, M Petit, S Lefebvre, F Costa
PCIM Europe 2018; International Exhibition and Conference for Power …, 2018
15 2018 Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode OA Salvado, H Morel, C Buttay, D Labrousse, S Lefebvre
Microelectronics Reliability 88, 636-640, 2018
14 2018 Robustness of SiC MOSFETs in short-circuit mode C Chen, D Labrousse, S Lefebvre, M Petit, C Buttay, H Morel
PCIM Europe 2015, 2015
13 2015 Control for the currents balancing of a multicell interleaved converter with ICT C Gautier, F Adam, E Laboure, B Revol, D Labrousse
2013 15th European Conference on Power Electronics and Applications (EPE), 1-9, 2013
13 2013 Ultra-low power, low voltage, self-powered resonant DC–DC converter for energy harvesting SE Adami, N Degrenne, W Haboubi, H Takhedmit, D Labrousse, F Costa, ...
Journal of Low Power Electronics 9 (1), 103-117, 2013
13 2013 Experimental investigation of the reliability of Printed Circuit Board (PCB)-embedded power dies with pressed contact made of metal foam Y Pascal, D Labrousse, M Petit, S Lefebvre, F Costa
Microelectronics Reliability 88, 707-714, 2018
12 2018 A combined CM & DM conducted EMI modeling approach: Application to a non-isolated on-board single-phase charger for electric vehicles C Saber, D Labrousse, B Revol, A Gascher
2017 International Symposium on Electromagnetic Compatibility-EMC EUROPE, 1-6, 2017
12 2017