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Denis Labrousse
Denis Labrousse
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Adresse e-mail validée de crans.org
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Study of short-circuit robustness of SiC MOSFETs, analysis of the failure modes and comparison with BJTs
C Chen, D Labrousse, S Lefebvre, M Petit, C Buttay, H Morel
Microelectronics Reliability 55 (9-10), 1708-1713, 2015
872015
Challenges facing PFC of a single-phase on-board charger for electric vehicles based on a current source active rectifier input stage
C Saber, D Labrousse, B Revol, A Gascher
IEEE Transactions on Power Electronics 31 (9), 6192-6202, 2015
652015
Self-starting DC: DC boost converter for low-power and low-voltage microbial electric generators
N Degrenne, F Buret, F Morel, SE Adami, D Labrousse, B Allard, A Zaoui
2011 IEEE Energy Conversion Congress and Exposition, 889-896, 2011
502011
Robustness in short-circuit mode of SiC MOSFETs
C Chen, D Labrousse, S Lefebvre, M Petit, C Buttay, H Morel
Proceedings of PCIM Europe 2015; International Exhibition and Conference for …, 2015
402015
Common-Mode Modeling of the Association of -Switching Cells: Application to an Electric-Vehicle-Drive System
D Labrousse, B Revol, F Costa
IEEE Transactions on Power Electronics 25 (11), 2852-2859, 2010
352010
Comparison of 3 self-starting step-up DC: DC converter topologies for harvesting energy from low-voltage and low-power microbial fuel cells
N Degrenne, B Allard, F Buret, F Morel, SE Adami, D Labrousse
Proceedings of the 2011 14th European Conference on Power Electronics and …, 2011
342011
[131] experimental study of the short-circuit robustness of 600 V E-mode GaN transistors
M Landel, C Gautier, D Labrousse, S Lefebvre
Microelectronics Reliability 64, 560-565, 2016
312016
Using laminated metal foam as the top-side contact of a PCB-embedded power die
Y Pascal, A Abdedaim, D Labrousse, M Petit, S Lefebvre, F Costa
IEEE Electron Device Letters 38 (10), 1453-1456, 2017
302017
A 140 mV self-starting 10 mW DC/DC converter for powering low-power electronic devices from low-voltage microbial fuel cells
N Degrenne, B Allard, F Buret, SE Adami, D Labrousse, C Vollaire, ...
Journal of Low Power Electronics 8 (4), 485-497, 2012
222012
Dispersion of electrical characteristics and short-circuit robustness of 600 V emode GaN transistors
M Landel, C Gautier, D Labrousse, S Levebvre, F Zaki, Z Khatir
PCIM Europe 2017; International Exhibition and Conference for Power …, 2017
192017
Thermal management for GaN power devices mounted on PCB substrates
S Zhang, E Laboure, D Labrousse, S Lefebvre
2017 IEEE International Workshop On Integrated Power Packaging (IWIPP), 1-5, 2017
172017
Estimating current distributions in power semiconductor dies under aging conditions: Bond wire liftoff and aluminum reconstruction
TA Nguyen, S Lefebvre, PY Joubert, D Labrousse, S Bontemps
IEEE Transactions on Components, Packaging and Manufacturing Technology 5 (4 …, 2015
172015
SiC MOSFETs robustness for diode-less applications
O Avino-Salvado, C Cheng, C Buttay, H Morel, D Labrousse, S Lefebvre, ...
EPE Journal 28 (3), 128-135, 2018
152018
PCB-embedding of power dies using pressed metal foam
Y Pascal, D Labrousse, M Petit, S Lefebvre, F Costa
PCIM Europe 2018; International Exhibition and Conference for Power …, 2018
152018
Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode
OA Salvado, H Morel, C Buttay, D Labrousse, S Lefebvre
Microelectronics Reliability 88, 636-640, 2018
142018
Robustness of SiC MOSFETs in short-circuit mode
C Chen, D Labrousse, S Lefebvre, M Petit, C Buttay, H Morel
PCIM Europe 2015, 2015
132015
Control for the currents balancing of a multicell interleaved converter with ICT
C Gautier, F Adam, E Laboure, B Revol, D Labrousse
2013 15th European Conference on Power Electronics and Applications (EPE), 1-9, 2013
132013
Ultra-low power, low voltage, self-powered resonant DC–DC converter for energy harvesting
SE Adami, N Degrenne, W Haboubi, H Takhedmit, D Labrousse, F Costa, ...
Journal of Low Power Electronics 9 (1), 103-117, 2013
132013
Experimental investigation of the reliability of Printed Circuit Board (PCB)-embedded power dies with pressed contact made of metal foam
Y Pascal, D Labrousse, M Petit, S Lefebvre, F Costa
Microelectronics Reliability 88, 707-714, 2018
122018
A combined CM & DM conducted EMI modeling approach: Application to a non-isolated on-board single-phase charger for electric vehicles
C Saber, D Labrousse, B Revol, A Gascher
2017 International Symposium on Electromagnetic Compatibility-EMC EUROPE, 1-6, 2017
122017
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