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Yves Rolain
Yves Rolain
VUB dept ELEC
Adresse e-mail validée de vub.ac.be - Page d'accueil
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Parametric identification of transfer functions in the frequency domain-a survey
R Pintelon, P Guillaume, Y Rolain, J Schoukens, H Van Hamme
IEEE transactions on automatic control 39 (11), 2245-2260, 1994
6611994
Identification of linear systems with nonlinear distortions
J Schoukens, R Pintelon, T Dobrowiecki, Y Rolain
Automatica 41 (3), 491-504, 2005
2372005
Low-area active-feedback low-noise amplifier design in scaled digital CMOS
J Borremans, P Wambacq, C Soens, Y Rolain, M Kuijk
IEEE Journal of Solid-State Circuits 43 (11), 2422-2433, 2008
2102008
Fast approximate identification of nonlinear systems
J Schoukens, JG Németh, P Crama, Y Rolain, R Pintelon
Automatica 39 (7), 1267-1274, 2003
1432003
A 57-to-66GHz quadrature PLL in 45nm digital CMOS
K Scheir, G Vandersteen, Y Rolain, P Wambacq
2009 IEEE International Solid-State Circuits Conference-Digest of Technical …, 2009
1372009
A 52 GHz phased-array receiver front-end in 90 nm digital CMOS
K Scheir, S Bronckers, J Borremans, P Wambacq, Y Rolain
IEEE Journal of Solid-State Circuits 43 (12), 2651-2659, 2008
1372008
Mastering system identification in 100 exercises
J Schoukens, R Pintelon, Y Rolain
John Wiley & Sons, 2012
1352012
A large-signal network analyzer: Why is it needed?
W Van Moer, Y Rolain
IEEE Microwave Magazine 7 (6), 46-62, 2006
982006
Frequency response function measurements in the presence of nonlinear distortions
J Schoukens, R Pintelon, Y Rolain, T Dobrowiecki
Automatica 37 (6), 939-946, 2001
922001
Best conditioned parametric identification of transfer function models in the frequency domain
Y Rolain, R Pintelon, KQ Xu, H Vold
IEEE Transactions on Automatic Control 40 (11), 1954-1960, 1995
891995
Experimental characterization of operational amplifiers: a system identification approach-Part I: theory and simulations
R Pintelon, G Vandersteen, L De Locht, Y Rolain, J Schoukens
IEEE Transactions on Instrumentation and Measurement 53 (3), 854-862, 2004
822004
Parametric identification of parallel Hammerstein systems
M Schoukens, R Pintelon, Y Rolain
IEEE Transactions on Instrumentation and Measurement 60 (12), 3931-3938, 2011
792011
Fully automated spectral analysis of periodic signals
J Schoukens, Y Rolain, G Simon, R Pintelon
IEEE Transactions on instrumentation and measurement 52 (4), 1021-1024, 2003
782003
Analysis of windowing/leakage effects in frequency response function measurements
J Schoukens, Y Rolain, R Pintelon
Automatica 42 (1), 27-38, 2006
752006
Improved (non-) parametric identification of dynamic systems excited by periodic signals—The multivariate case
R Pintelon, G Vandersteen, J Schoukens, Y Rolain
Mechanical Systems and Signal Processing 25 (8), 2892-2922, 2011
732011
Broadband versus stepped sine FRF measurements
J Schoukens, R Pintelon, Y Rolain
IMTC/99. Proceedings of the 16th IEEE Instrumentation and Measurement …, 1999
721999
Identification of Wiener–Hammerstein systems by a nonparametric separation of the best linear approximation
M Schoukens, R Pintelon, Y Rolain
Automatica 50 (2), 628-634, 2014
662014
Multirate cascaded discrete-time low-pass ΔΣ modulator for GSM/Bluetooth/UMTS
L Bos, G Vandersteen, P Rombouts, A Geis, A Morgado, Y Rolain, ...
IEEE Journal of Solid-State Circuits 45 (6), 1198-1208, 2010
662010
Analyses, development, and applications of TLS algorithms in frequency domain system identification
R Pintelon, P Guillaume, G Vandersteen, Y Rolain
SIAM journal on matrix analysis and applications 19 (4), 983-1004, 1998
611998
A 0.5 mm Power-Scalable 0.5–3.8-GHz CMOS DT-SDR Receiver With Second-Order RF Band-Pass Sampler
A Geis, J Ryckaert, L Bos, G Vandersteen, Y Rolain, J Craninckx
IEEE Journal of Solid-State Circuits 45 (11), 2375-2387, 2010
572010
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