Zh. Ebrahiminejad
Zh. Ebrahiminejad
Affiliation inconnue
Adresse e-mail validée de alzahra.ac.ir
Titre
Citée par
Citée par
Année
Spin-dependent tunneling through double-barrier quantum wells with random corrugation interfacial roughness
AA Shokri, ZH Ebrahiminejad
Physica E: Low-dimensional Systems and Nanostructures 43 (9), 1579-1584, 2011
112011
Thin film growth by deposition of randomly shaped clusters
Z Ebrahiminejad, SF Masoudi, RS Dariani, SS Jahromi
The Journal of chemical physics 137 (15), 154703, 2012
102012
The sheath criterion for a collisional plasma sheath at the presence of external magnetic field
SF Masoudi, Z Ebrahiminejad
The European Physical Journal D 59 (3), 421-425, 2010
92010
The interfacial roughness effect on spin-dependent transport in nonplanar junctions with double magnetic barriers
AA Shokri, ZH Ebrahiminejad, SF Masoudi
Thin Solid Films 519 (7), 2193-2200, 2011
82011
Effects of self-affine roughness characteristics on electron transmission through tunneling structures
Z Ebrahiminejad, SF Masoudi, GR Jafari, RS Dariani
Thin solid films 522, 233-237, 2012
52012
Structural and mechanical properties of tantalum thin films ected by nitrogen ion implantation
AH Ramezani, S Hoseinzadeh, Z Ebrahiminejad
Modern Physics Letters B 34 (15), 2050163, 2020
32020
Effects of interface structure on spin filter tunnel junctions
SF Masoudi, Z Ebrahiminejad
Surface science 630, 85-88, 2014
32014
Spin-polarized electron transfer in multilayers with different types of rough interfaces
AH Ramezani, S Hoseinzadeh, ZH Ebrahiminejad, SF Masoudi, ...
Journal of Superconductivity and Novel Magnetism 33 (5), 1513-1519, 2020
22020
The study of mechanical and statistical properties of nitrogen ion-implanted Tantalum bulk
AH Ramezani, S Hoseinzadeh, Z Ebrahiminejad, MR Hantehzadeh, ...
Optik 225, 165628, 2021
12021
Statistical and fractal analysis of nitrogen ion implanted tantalum thin films
AH Ramezani, S Hoseinzadeh, Z Ebrahiminejad
Applied Physics A 126, 1-6, 2020
12020
Effect of different types of interface roughness on electron conductance
Z Ebrahiminejad, RS Dariani, SF Masoudi
Electronic Materials Letters 10 (3), 573-578, 2014
12014
The study of transport properties in rough ferromagnetic semiconductor rough junctions
Z Ebrahiminejad, RS Dariani, SF Masoudi
Physica E: Low-dimensional Systems and Nanostructures 48, 70-74, 2013
12013
Thin film growth by using random shape cluster deposition
ZH Ebrahiminejad, SF Masoudi, RS Dariani, SS Jahromi
arXiv preprint arXiv:1205.3956, 2012
12012
Surface characterization of Cu-doped indium sulfide thin films
Z Ebrahiminejad, S Asgary, P Esmaili
Indian Journal of Physics, 1-5, 2021
2021
Electrical conductivity of thin films grown by deposition of random clusters of particles
Z Ebrahiminejad, H Hamzehpour, SF Masoudi
Journal of Materials Science: Materials in Electronics 31 (20), 18297-18306, 2020
2020
Statistical analysis of thin films produced by random shaped clusters
Z Ebrahiminejad, SF Masoudi
Materials Research Express 6 (11), 116406, 2019
2019
Study of roughness parameters effect on IV characteristic of resonant tunneling diodes
F Masoudi
Journal Modern Research Physics 2 (2), 1-10, 2018
2018
Le système ne peut pas réaliser cette opération maintenant. Veuillez réessayer plus tard.
Articles 1–17