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Donghwan Shin
Donghwan Shin
Lecturer (Assistant Professor), University of Sheffield
Verified email at sheffield.ac.uk - Homepage
Title
Cited by
Cited by
Year
Are mutation scores correlated with real fault detection? a large scale empirical study on the relationship between mutants and real faults
M Papadakis, D Shin, S Yoo, DH Bae
Proceedings of the 40th international conference on software engineering …, 2018
1352018
Comparing offline and online testing of deep neural networks: An autonomous car case study
FU Haq, D Shin, S Nejati, LC Briand
2020 IEEE 13th International Conference on Software Testing, Validation and …, 2020
612020
Efficient online testing for dnn-enabled systems using surrogate-assisted and many-objective optimization
FU Haq, D Shin, L Briand
Proceedings of the 44th international conference on software engineering …, 2022
512022
Automated test case generation for FBD programs implementing reactor protection system software
E Jee, D Shin, S Cha, JS Lee, DH Bae
Software Testing, Verification and Reliability 24 (8), 608-628, 2014
482014
Empirical evaluation of mutation‐based test case prioritization techniques
D Shin, S Yoo, M Papadakis, DH Bae
Software Testing, Verification and Reliability 29 (1-2), e1695, 2019
412019
A theoretical and empirical study of diversity-aware mutation adequacy criterion
D Shin, S Yoo, DH Bae
IEEE Transactions on Software Engineering 44 (10), 914-931, 2017
392017
A theoretical framework for understanding mutation-based testing methods
D Shin, DH Bae
2016 IEEE International Conference on Software Testing, Verification and …, 2016
362016
Can Offline Testing of Deep Neural Networks Replace Their Online Testing?
FU Haq, D Shin, S Nejati, L Briand
Empirical Software Engineering 26 (5), 1-30, 2021
31*2021
Empirical evaluation on FBD model-based test coverage criteria using mutation analysis
D Shin, E Jee, DH Bae
Model Driven Engineering Languages and Systems: 15th International …, 2012
312012
Digital twins are not monozygotic–cross-replicating adas testing in two industry-grade automotive simulators
M Borg, RB Abdessalem, S Nejati, FX Jegeden, D Shin
2021 14th IEEE Conference on Software Testing, Verification and Validation …, 2021
302021
Formal modeling and verification of a federated byzantine agreement algorithm for blockchain platforms
J Yoo, Y Jung, D Shin, M Bae, E Jee
2019 IEEE International Workshop on Blockchain Oriented Software Engineering …, 2019
272019
Guidelines for assessing the accuracy of log message template identification techniques
ZA Khan, D Shin, D Bianculli, L Briand
Proceedings of the 44th International Conference on Software Engineering …, 2022
252022
Human resource allocation in software project with practical considerations
J Park, D Seo, G Hong, D Shin, J Hwa, DH Bae
International Journal of Software Engineering and Knowledge Engineering 25 …, 2015
252015
Modeling and verification for different types of system of systems using prism
D Seo, D Shin, YM Baek, J Song, W Yun, J Kim, E Jee, DH Bae
Proceedings of the 4th International Workshop on Software Engineering for …, 2016
242016
Comprehensive analysis of FBD test coverage criteria using mutants
D Shin, E Jee, DH Bae
Software & Systems Modeling 15 (3), 631-645, 2016
192016
Practical Human Resource Allocation in Software Projects Using Genetic Algorithm
J Park, D Seo, G Hong, D Shin, J Hwa, DH Bae
182014
Automatic test suite generation for key-points detection DNNs using many-objective search (experience paper)
FU Haq, D Shin, LC Briand, T Stifter, J Wang
Proceedings of the 30th ACM SIGSOFT International Symposium on Software …, 2021
172021
Log-based slicing for system-level test cases
S Messaoudi, D Shin, A Panichella, D Bianculli, LC Briand
Proceedings of the 30th ACM SIGSOFT international symposium on software …, 2021
162021
A runtime verification framework for dynamically adaptive multi-agent systems
YJ Lim, G Hong, D Shin, E Jee, DH Bae
2016 International Conference on Big Data and Smart Computing (BigComp), 509-512, 2016
162016
Diversity-Aware Mutation Adequacy Criterion for Improving Fault Detection Capability
D Shin, S Yoo, DH Bae
2016 IEEE Ninth International Conference on Software Testing, Verification …, 2016
142016
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