Suivre
Anil Koyuncu
Anil Koyuncu
Adresse e-mail validée de uni.lu
Titre
Citée par
Citée par
Année
Tbar: Revisiting template-based automated program repair
K Liu, A Koyuncu, D Kim, TF Bissyandé
Proceedings of the 28th ACM SIGSOFT international symposium on software …, 2019
2852019
Fixminer: Mining relevant fix patterns for automated program repair
A Koyuncu, K Liu, TF Bissyandé, D Kim, J Klein, M Monperrus, Y Le Traon
Empirical Software Engineering 25, 1980-2024, 2020
2092020
Avatar: Fixing semantic bugs with fix patterns of static analysis violations
K Liu, A Koyuncu, D Kim, TF Bissyandé
2019 IEEE 26th International Conference on Software Analysis, Evolution and …, 2019
1802019
You cannot fix what you cannot find! an investigation of fault localization bias in benchmarking automated program repair systems
K Liu, A Koyuncu, TF Bissyandé, D Kim, J Klein, Y Le Traon
2019 12th IEEE conference on software testing, validation and verification …, 2019
1502019
On the efficiency of test suite based program repair: A systematic assessment of 16 automated repair systems for java programs
K Liu, S Wang, A Koyuncu, K Kim, TF Bissyandé, D Kim, P Wu, J Klein, ...
Proceedings of the ACM/IEEE 42nd International Conference on Software …, 2020
1442020
Learning to spot and refactor inconsistent method names
K Liu, D Kim, TF Bissyandé, T Kim, K Kim, A Koyuncu, S Kim, Y Le Traon
2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE), 1-12, 2019
1292019
Evaluating representation learning of code changes for predicting patch correctness in program repair
H Tian, K Liu, AK Kaboré, A Koyuncu, L Li, J Klein, TF Bissyandé
Proceedings of the 35th IEEE/ACM International Conference on Automated …, 2020
1042020
iFixR: Bug report driven program repair
A Koyuncu, K Liu, TF Bissyandé, D Kim, M Monperrus, J Klein, Y Le Traon
Proceedings of the 2019 27th ACM joint meeting on european software …, 2019
1022019
LSRepair: Live search of fix ingredients for automated program repair
K Liu, A Koyuncu, K Kim, D Kim, TF Bissyandé
2018 25th Asia-Pacific Software Engineering Conference (APSEC), 658-662, 2018
762018
A critical review on the evaluation of automated program repair systems
K Liu, L Li, A Koyuncu, D Kim, Z Liu, J Klein, TF Bissyandé
Journal of Systems and Software 171, 110817, 2021
732021
A closer look at real-world patches
K Liu, D Kim, A Koyuncu, L Li, TF Bissyandé, Y Le Traon
2018 IEEE International Conference on Software Maintenance and Evolution …, 2018
612018
D&c: A divide-and-conquer approach to ir-based bug localization
A Koyuncu, TF Bissyandé, D Kim, K Liu, J Klein, M Monperrus, YL Traon
arXiv preprint arXiv:1902.02703, 2019
342019
Impact of tool support in patch construction
A Koyuncu, TF Bissyandé, D Kim, J Klein, M Monperrus, YL Traon
International Symposium on Software Testing and Analysis (ISSTA), 2017
262017
iBiR: Bug-report-driven Fault Injection
A Khanfir, A Koyuncu, M Papadakis, M Cordy, TF Bissyandé, J Klein, ...
ACM Transactions on Software Engineering and Methodology 32 (2), 1-31, 2023
242023
Where were the repair ingredients for defects4j bugs? exploring the impact of repair ingredient retrieval on the performance of 24 program repair systems
D Yang, K Liu, D Kim, A Koyuncu, K Kim, H Tian, Y Lei, X Mao, J Klein, ...
Empirical Software Engineering 26, 1-33, 2021
222021
The best of both worlds: Combining learned embeddings with engineered features for accurate prediction of correct patches
H Tian, K Liu, Y Li, AK Kaboré, A Koyuncu, A Habib, L Li, J Wen, J Klein, ...
ACM Transactions on Software Engineering and Methodology 32 (4), 1-34, 2023
152023
Learning to spot and refactor inconsistent method names. In 2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE)
K Liu, D Kim, TF Bissyandé, T Kim, K Kim, A Koyuncu, S Kim, Y Le Traon
IEEE, 1ś12, 2019
152019
Flexirepair: Transparent program repair with generic patches
A Koyuncu, TF Bissyandé, J Klein, YL Traon
arXiv preprint arXiv:2011.13280, 2020
82020
Reliable fix patterns inferred from static checkers for automated program repair
K Liu, J Zhang, L Li, A Koyuncu, D Kim, C Ge, Z Liu, J Klein, TF Bissyandé
ACM Transactions on Software Engineering and Methodology 32 (4), 1-38, 2023
52023
DigBug—Pre/post-processing operator selection for accurate bug localization
K Kim, S Ghatpande, K Liu, A Koyuncu, D Kim, TF Bissyandé, J Klein, ...
Journal of Systems and Software 189, 111300, 2022
52022
Le système ne peut pas réaliser cette opération maintenant. Veuillez réessayer plus tard.
Articles 1–20