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Yannick Deshayes
Yannick Deshayes
Université Bordeaux - Laboratoire IMS
Adresse e-mail validée de ims-bordeaux.fr
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Silver clusters embedded in glass as a perennial high capacity optical recording medium
A Royon, K Bourhis, M Bellec, G Papon, B Bousquet, Y Deshayes, ...
Advanced materials 22 (46), 5282-5286, 2010
2182010
Long‐term Reliability Prediction of 935 nm LEDs Using Failure Laws and Low Acceleration Factor Ageing Tests
Y Deshayes, L Bechou, F Verdier, Y Danto
Quality and Reliability Engineering International 21 (6), 571-594, 2005
442005
Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses
R Baillot, Y Deshayes, L Bechou, T Buffeteau, I Pianet, C Armand, ...
Microelectronics reliability 50 (9-11), 1568-1573, 2010
282010
Measurement of the thermal characteristics of packaged double-heterostructure light emitting diodes for space applications using spontaneous optical spectrum properties
L Bechou, O Rehioui, Y Deshayes, O Gilard, G Quadri, Y Ousten
Optics & Laser Technology 40 (4), 589-601, 2008
202008
Estimation of lifetime distributions on 1550-nm DFB laser diodes using Monte-Carlo statistic computations
Y Deshayes, F Verdier, L Bechou, B Tregon, Y Danto, D Laffitte, ...
Reliability of Optical Fiber Components, Devices, Systems, and Networks II …, 2004
192004
Early failure signatures of 1310 nm laser modules using electrical, optical and spectral measurements
Y Deshayes, L Bechou, L Mendizabal, Y Danto
Measurement 34 (2), 157-178, 2003
192003
Three-dimensional FEM simulations of thermomechanical stresses in 1.55 μm Laser modules
Y Deshayes, L Bechou, JY Delétage, F Verdier, Y Danto, D Laffitte, ...
Microelectronics Reliability 43 (7), 1125-1136, 2003
172003
Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations
JY Delétage, FJM Verdier, B Plano, Y Deshayes, L Bechou, Y Danto
Microelectronics Reliability 43 (7), 1137-1144, 2003
162003
Proton effects on low noise and high responsivity silicon-based photodiodes for space environment
G Pedroza, O Gilard, ML Bourqui, L Bechou, Y Deshayes, LS How, ...
Journal of applied physics 105 (2), 024513, 2009
152009
Durability study of a fluorescent optical memory in glass studied by luminescence spectroscopy
A Royon, K Bourhis, L Béchou, T Cardinal, L Canioni, Y Deshayes
Microelectronics Reliability 53 (9-11), 1514-1518, 2013
142013
Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications
ML Bourqui, L Béchou, O Gilard, Y Deshayes, P Del Vecchio, LS How, ...
Microelectronics Reliability 48 (8-9), 1202-1207, 2008
132008
High-power diode laser bars and shear strain
DT Cassidy, O Rehioui, CK Hall, L Béchou, Y Deshayes, A Kohl, ...
Optics letters 38 (10), 1633-1635, 2013
122013
Reliability Investigation of LED Devices for Public Light Applications
R Baillot, Y Deshayes
Elsevier, 2017
102017
Study of influence of failure modes on lifetime distribution prediction of 1.55 pum DFB Laser diodes using weak drift of monitored parameters during ageing tests L. Mendizabal …
D Laffitte, JL Goudard, F Houé
Microelectronics Reliability 44, 1337-1342, 2004
82004
Miniaturization of InGaP/InGaAs/Ge solar cells for micro‐concentrator photovoltaics
P Albert, A Jaouad, G Hamon, M Volatier, CE Valdivia, Y Deshayes, ...
Progress in Photovoltaics: Research and Applications 29 (9), 990-999, 2021
72021
Simulations of Thermomechanical Stresses and Optical Misalignment in 1550-nm Transmitter Optoelectronic Modules Using FEM and Process Dispersions
Y Deshayes, L Bechou, F Verdier, Y Ousten, D Laffitte, JL Goudard
IEEE Transactions on Components and Packaging Technologies 31 (4), 759-766, 2008
72008
Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation
Y Deshayes, I Bord, G Barreau, M Aiche, PH Moretto, L Béchou, ...
Microelectronics Reliability 48 (8-9), 1354-1360, 2008
72008
Practical optical gain by an extended Hakki-Paoli method
M Vanzi, G Marcello, G Mura, G Le Gales, S Joly, Y Deshayes, L Bechou
Microelectronics Reliability 76, 579-583, 2017
62017
Tools and analysis methods of encapsulated LEDs
R Baillot, Y Deshayes
Reliability Investigation of LED Devices for Public Light Applications, 43-106, 2017
62017
Extended modal gain measurement in DFB laser diodes
M Vanzi, G Marcello, G Mura, G Le Galès, S Joly, Y Deshayes, L Bechou
IEEE Photonics Technology Letters 29 (2), 197-200, 2016
62016
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