Yannick Deshayes
Yannick Deshayes
Université Bordeaux - Laboratoire IMS
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Silver clusters embedded in glass as a perennial high capacity optical recording medium
A Royon, K Bourhis, M Bellec, G Papon, B Bousquet, Y Deshayes, ...
Advanced materials 22 (46), 5282-5286, 2010
Long‐term Reliability Prediction of 935 nm LEDs Using Failure Laws and Low Acceleration Factor Ageing Tests
Y Deshayes, L Bechou, F Verdier, Y Danto
Quality and Reliability Engineering International 21 (6), 571-594, 2005
Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses
R Baillot, Y Deshayes, L Bechou, T Buffeteau, I Pianet, C Armand, ...
Microelectronics reliability 50 (9-11), 1568-1573, 2010
Measurement of the thermal characteristics of packaged double-heterostructure light emitting diodes for space applications using spontaneous optical spectrum properties
L Bechou, O Rehioui, Y Deshayes, O Gilard, G Quadri, Y Ousten
Optics & Laser Technology 40 (4), 589-601, 2008
Estimation of lifetime distributions on 1550-nm DFB laser diodes using Monte-Carlo statistic computations
Y Deshayes, F Verdier, L Bechou, B Tregon, Y Danto, D Laffitte, ...
Reliability of Optical Fiber Components, Devices, Systems, and Networks II …, 2004
Early failure signatures of 1310 nm laser modules using electrical, optical and spectral measurements
Y Deshayes, L Bechou, L Mendizabal, Y Danto
Measurement 34 (2), 157-178, 2003
Three-dimensional FEM simulations of thermomechanical stresses in 1.55 μm Laser modules
Y Deshayes, L Bechou, JY Delétage, F Verdier, Y Danto, D Laffitte, ...
Microelectronics Reliability 43 (7), 1125-1136, 2003
Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations
JY Delétage, FJM Verdier, B Plano, Y Deshayes, L Bechou, Y Danto
Microelectronics Reliability 43 (7), 1137-1144, 2003
Proton effects on low noise and high responsivity silicon-based photodiodes for space environment
G Pedroza, O Gilard, ML Bourqui, L Bechou, Y Deshayes, LS How, ...
Journal of applied physics 105 (2), 024513, 2009
Durability study of a fluorescent optical memory in glass studied by luminescence spectroscopy
A Royon, K Bourhis, L Béchou, T Cardinal, L Canioni, Y Deshayes
Microelectronics Reliability 53 (9-11), 1514-1518, 2013
Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications
ML Bourqui, L Béchou, O Gilard, Y Deshayes, P Del Vecchio, LS How, ...
Microelectronics Reliability 48 (8-9), 1202-1207, 2008
High-power diode laser bars and shear strain
DT Cassidy, O Rehioui, CK Hall, L Béchou, Y Deshayes, A Kohl, ...
Optics letters 38 (10), 1633-1635, 2013
Reliability Investigation of LED Devices for Public Light Applications
R Baillot, Y Deshayes
Elsevier, 2017
Study of influence of failure modes on lifetime distribution prediction of 1.55 pum DFB Laser diodes using weak drift of monitored parameters during ageing tests L. Mendizabal …
D Laffitte, JL Goudard, F Houé
Microelectronics Reliability 44, 1337-1342, 2004
Miniaturization of InGaP/InGaAs/Ge solar cells for micro‐concentrator photovoltaics
P Albert, A Jaouad, G Hamon, M Volatier, CE Valdivia, Y Deshayes, ...
Progress in Photovoltaics: Research and Applications 29 (9), 990-999, 2021
Simulations of Thermomechanical Stresses and Optical Misalignment in 1550-nm Transmitter Optoelectronic Modules Using FEM and Process Dispersions
Y Deshayes, L Bechou, F Verdier, Y Ousten, D Laffitte, JL Goudard
IEEE Transactions on Components and Packaging Technologies 31 (4), 759-766, 2008
Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation
Y Deshayes, I Bord, G Barreau, M Aiche, PH Moretto, L Béchou, ...
Microelectronics Reliability 48 (8-9), 1354-1360, 2008
Practical optical gain by an extended Hakki-Paoli method
M Vanzi, G Marcello, G Mura, G Le Gales, S Joly, Y Deshayes, L Bechou
Microelectronics Reliability 76, 579-583, 2017
Tools and analysis methods of encapsulated LEDs
R Baillot, Y Deshayes
Reliability Investigation of LED Devices for Public Light Applications, 43-106, 2017
Extended modal gain measurement in DFB laser diodes
M Vanzi, G Marcello, G Mura, G Le Galès, S Joly, Y Deshayes, L Bechou
IEEE Photonics Technology Letters 29 (2), 197-200, 2016
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