Amit Kumar Sahoo
Amit Kumar Sahoo
SMTS TD Device Engineer
Adresse e-mail validée de globalfoundries.com
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A scalable electrothermal model for transient self-heating effects in trench-isolated SiGe HBTs
AK Sahoo, S Frégonèse, M Weis, N Malbert, T Zimmer
IEEE transactions on electron devices 59 (10), 2619-2625, 2012
352012
Effects of BEOL on self-heating and thermal coupling in SiGe multi-finger HBTs under real operating condition
ADD Dwivedi, A Chakravorty, R D’esposito, AK Sahoo, S Fregonese, ...
Solid-State Electronics 115, 1-6, 2016
192016
Thermal analysis of AlN/GaN/AlGaN HEMTs grown on Si and SiC substrate through TCAD simulations and measurements
AK Sahoo, NK Subramani, JC Nallatamby, R Sommet, R Quéré, ...
2016 11th European Microwave Integrated Circuits Conference (EuMIC), 145-148, 2016
182016
Small signal modeling of high electron mobility transistors on silicon and silicon carbide substrate with consideration of substrate loss mechanism
AK Sahoo, NK Subramani, JC Nallatamby, L Sylvain, C Loyez, R Quéré, ...
Solid-State Electronics 115, 12-16, 2016
182016
Impact of back-end-of-line on thermal impedance in SiGe HBTs
AK Sahoo, S Fregonese, M Weiß, C Maneux, N Malbert, T Zimmer
2013 International Conference on Simulation of Semiconductor Processes and …, 2013
182013
Mutual thermal coupling in SiGe: C HBTs
M Weiß, AK Sahoo, C Maneux, S Fregonese, T Zimmer
28th Symposium on Microelectronics Technology and Devices (SBMicro 2013), 1-4, 2013
162013
Electro-thermal characterization of Si-Ge HBTs with pulse measurement and transient simulation
AK Sahoo, S Fregonese, M Weiß, N Malbert, T Zimmer
2011 Proceedings of the European Solid-State Device Research Conference …, 2011
152011
Thermal impedance modeling of Si–Ge HBTs from low-frequency small-signal measurements
AK Sahoo, S Fregonese, T Zimmer, N Malbert
IEEE Electron Device Letters 32 (2), 119-121, 2010
152010
A geometry scalable model for nonlinear thermal impedance of trench isolated HBTs
AK Sahoo, S Fregonese, R Desposito, K Aufinger, C Maneux, T Zimmer
IEEE Electron Device Letters 36 (1), 56-58, 2014
132014
Characterization of parasitic resistances of AlN/GaN/AlGaN HEMTs through TCAD-based device simulations and on-wafer measurements
NK Subramani, AK Sahoo, JC Nallatamby, R Sommet, N Rolland, ...
IEEE Transactions on Microwave Theory and Techniques 64 (5), 1351-1358, 2016
122016
A scalable model for temperature dependent thermal resistance of SiGe HBTs
AK Sahoo, S Fregonese, M Weiß, C Maneux, T Zimmer
2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 29-32, 2013
122013
Temperature dependent contact and channel sheet resistance extraction of GaN HEMT
AK Sahoo, NK Subramani, JC Nallatamby, N Rolland, R Quéré, ...
2015 Integrated Nonlinear Microwave and Millimetre-wave Circuits Workshop …, 2015
112015
Electro-thermal Characterizations, Compact Modeling and TCAD based Device Simulations of advanced SiGe:C BiCMOS HBTs and of nanometric CMOS FET
AK SAHOO
PhD Thesis _ IMS Laboratory, 2012
11*2012
Characterization of intra device mutual thermal coupling in multi finger SiGe: C HBTs
M Weiß, AK Sahoo, C Raya, M Santorelli, S Fregonese, C Maneux, ...
2013 IEEE International Conference of Electron Devices and Solid-state …, 2013
102013
Transient electro-thermal characterization of Si–Ge heterojunction bipolar transistors
AK Sahoo, M Weiß, S Fregonese, N Malbert, T Zimmer
Solid-state electronics 74, 77-84, 2012
102012
Electro-thermal dynamic simulation and thermal spreading impedance modeling of Si-Ge HBTs
AK Sahoo, S Fregonese, M Weiß, N Malbert, T Zimmer
2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting, 45-48, 2011
92011
A study on transient intra-device thermal coupling in multifinger SiGe HBTs (Student)
R d'Esposito, M Weiß, AK Sahoo, S Fregonese, T Zimmer
2014 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 179-182, 2014
82014
Optimized ring oscillator with 1.65-ps gate delay in a SiGe: C HBT technology
M Weiß, C Majek, AK Sahoo, C Maneux, O Mazouffre, P Chevalier, ...
IEEE electron device letters 34 (10), 1214-1216, 2013
82013
A study on self-heating and mutual thermal coupling in SiGe multi-finger HBTs
ADD Dwivedi, R D’esposito, AK Sahoo, S Fregonese, T Zimmer
Journal of Electronic Materials 45 (11), 5612-5620, 2016
72016
80 ns/45 GHz pulsed measurement system for DC and RF characterization of high speed microwave devices
M Weiß, S Fregonese, M Santorelli, AK Sahoo, C Maneux, T Zimmer
Solid-state electronics 84, 74-82, 2013
72013
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