Patrick Sandoz
Patrick Sandoz
Senior Researcher, CNRS, Institut FEMTO-ST
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Wavelet transform as a processing tool in white-light interferometry
P Sandoz
Optics letters 22 (14), 1065-1067, 1997
Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry
P Sandoz, R Devillers, A Plata
Journal of modern optics 44 (3), 519-534, 1997
High-resolution profilometry by using phase calculation algorithms for spectroscopic analysis of white-light interferograms
P Sandoz, G Tribillon, H Perrin
Journal of Modern Optics 43 (4), 701-708, 1996
An algorithm for profilometry by white-light phase-shifting interferometry
P Sandoz
Journal of modern optics 43 (8), 1545-1554, 1996
High resolution digital holography
M Jacquot, P Sandoz, G Tribillon
Optics communications 190 (1-6), 87-94, 2001
Profilometry by zero-order interference fringe identification
P Sandoz, G Tribillon
Taylor & Francis Group 40 (9), 1691-1700, 1993
Fiber microaxicons fabricated by a polishing technique for the generation of Bessel-like beams
T Grosjean, SS Saleh, MA Suarez, IA Ibrahim, V Piquerey, D Charraut, ...
Applied optics 46 (33), 8061-8067, 2007
Sensing one nanometer over ten centimeters: A microencoded target for visual in-plane position measurement
AN André, P Sandoz, B Mauzé, M Jacquot, GJ Laurent
IEEE/ASME Transactions on Mechatronics 25 (3), 1193-1201, 2020
Processing of white-light correlograms: simultaneous phase and envelope measurements by wavelet transformation
P Sandoz, M Jacquot
Optical Inspection and Micromeasurements II 3098, 73-82, 1997
2D visual micro-position measurement based on intertwined twin-scale patterns
V Guelpa, P Sandoz, MA Vergara, C Clévy, N Le Fort-Piat, GJ Laurent
Sensors and Actuators A: Physical 248, 272-280, 2016
Optical implementation of frequency domain analysis for white-light interferometry
P Sandoz, H Perrin, GM Tribillon, JE Calatroni, AL Guerrero, C Sainz, ...
Interferometry VII: Applications 2545, 221-228, 1995
High-accuracy position and orientation measurement of extended two-dimensional surfaces by a phase-sensitive vision method
P Sandoz, V Bonnans, T Gharbi
Applied optics 41 (26), 5503-5511, 2002
Phase-sensitive vision technique for high accuracy position measurement of moving targets
P Sandoz, JC Ravassard, S Dembele, A Janex
IEEE Transactions on instrumentation and measurement 49 (4), 867-872, 2000
Roughness measurement by confocal microscopy for brightness characterization and surface waviness visibility evaluation
P Sandoz, G Tribillon, T Gharbi, R Devillers
Wear 201 (1-2), 186-192, 1996
Nanometer precision with a planar parallel continuum robot
B Mauzé, R Dahmouche, GJ Laurent, AN André, P Rougeot, P Sandoz, ...
IEEE Robotics and Automation Letters 5 (3), 3806-3813, 2020
Reactive-homeostasis as a cybernetic model of the silhouette effect of denial of pregnancy
P Sandoz
Medical hypotheses 77 (5), 782-785, 2011
In-plane rigid-body vibration mode characterization with a nanometer resolution by stroboscopic imaging of a microstructured pattern
P Sandoz, JM Friedt, E Carry
Review of scientific instruments 78 (2), 2007
Intra‐and inter‐individual variability in the mechanical properties of the human skin from in vivo measurements on 20 volunteers
E Jacquet, J Chambert, J Pauchot, P Sandoz
Skin Research and Technology 23 (4), 491-499, 2017
Position referencing in optical microscopy thanks to sample holders with out‐of‐focus encoded patterns
P Sandoz, R Zeggari, L Froehly, JL Pretet, C Mougin
Journal of Microscopy 225 (3), 293-303, 2007
Pseudo-periodic encryption of extended 2-D surfaces for high accurate recovery of any random zone by vision
JA Galeano-Zea, P Sandoz, E Gaiffe, JL Prétet, C Mougin
International Journal of Optomechatronics 4 (1), 65-82, 2010
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