Patrick Sandoz
Patrick Sandoz
Senior Researcher, CNRS, FEMTO-ST Institute
Adresse e-mail validée de - Page d'accueil
Citée par
Citée par
Wavelet transform as a processing tool in white-light interferometry
P Sandoz
Optics letters 22 (14), 1065-1067, 1997
High-resolution profilometry by using phase calculation algorithms for spectroscopic analysis of white-light interferograms
P Sandoz, G Tribillon, H Perrin
Journal of Modern Optics 43 (4), 701-708, 1996
Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry
P Sandoz, R Devillers, A Plata
Journal of modern optics 44 (3), 519-534, 1997
An algorithm for profilometry by white-light phase-shifting interferometry
P Sandoz
Journal of modern optics 43 (8), 1545-1554, 1996
Profilometry by zero-order interference fringe identification
P Sandoz, G Tribillon
Taylor & Francis Group 40 (9), 1691-1700, 1993
High resolution digital holography
M Jacquot, P Sandoz, G Tribillon
Optics communications 190 (1-6), 87-94, 2001
Fiber microaxicons fabricated by a polishing technique for the generation of Bessel-like beams
T Grosjean, SS Saleh, MA Suarez, IA Ibrahim, V Piquerey, D Charraut, ...
Applied optics 46 (33), 8061-8067, 2007
Processing of white-light correlograms: simultaneous phase and envelope measurements by wavelet transformation
P Sandoz, M Jacquot
Optical Inspection and Micromeasurements II 3098, 73-82, 1997
Roughness measurement by confocal microscopy for brightness characterization and surface waviness visibility evaluation
P Sandoz, G Tribillon, T Gharbi, R Devillers
Wear 201 (1-2), 186-192, 1996
Optical implementation of frequency domain analysis for white-light interferometry
P Sandoz, H Perrin, GM Tribillon, JE Calatroni, AL Guerrero, C Sainz, ...
Interferometry VII: Applications 2545, 221-228, 1995
Phase-sensitive vision technique for high accuracy position measurement of moving targets
P Sandoz, JC Ravassard, S Dembele, A Janex
IEEE Transactions on instrumentation and measurement 49 (4), 867-872, 2000
High-accuracy position and orientation measurement of extended two-dimensional surfaces by a phase-sensitive vision method
P Sandoz, V Bonnans, T Gharbi
Applied optics 41 (26), 5503-5511, 2002
In-plane rigid-body vibration mode characterization with a nanometer resolution by stroboscopic imaging of a microstructured pattern
P Sandoz, JM Friedt, E Carry
Review of scientific instruments 78 (2), 023706, 2007
Position referencing in optical microscopy thanks to sample holders with out‐of‐focus encoded patterns
P Sandoz, R Zeggari, L Froehly, JL Pretet, C Mougin
Journal of Microscopy 225 (3), 293-303, 2007
Pseudo-periodic encryption of extended 2-D surfaces for high accurate recovery of any random zone by vision
JA Galeano-Zea, P Sandoz, E Gaiffe, JL Prétet, C Mougin
International Journal of Optomechatronics 4 (1), 65-82, 2010
Surface profiling by means of double spectral modulation
JE Calatroni, P Sandoz, G Tribillon
Applied optics 32 (1), 30-37, 1993
Reactive-homeostasis as a cybernetic model of the silhouette effect of denial of pregnancy
P Sandoz
Medical hypotheses 77 (5), 782-785, 2011
Position-referenced microscopy for live cell culture monitoring
P Sandoz, E Gaiffe, S Launay, L Robert, M Jacquot, F Hirchaud, JL Prétet, ...
Biomedical optics express 2 (5), 1307-1318, 2011
Vibration amplitude of a tip-loaded quartz tuning fork during shear force microscopy scanning
P Sandoz, JM Friedt, E Carry
Review of Scientific Instruments 79 (8), 086102, 2008
2D visual micro-position measurement based on intertwined twin-scale patterns
V Guelpa, P Sandoz, MA Vergara, C Clévy, N Le Fort-Piat, GJ Laurent
Sensors and Actuators A: Physical 248, 272-280, 2016
Le système ne peut pas réaliser cette opération maintenant. Veuillez réessayer plus tard.
Articles 1–20