| Life expectancy and characterization of capacitive RF MEMS switches M Matmat, K Koukos, F Coccetti, T Idda, A Marty, C Escriba, JY Fourniols, ... Microelectronics Reliability 50 (9-11), 1692-1696, 2010 | 29 | 2010 |
| Capacitive RF MEMS analytical predictive reliability and lifetime characterization M Matmat, F Coccetti, A Marty, R Plana, C Escriba, JY Fourniols, D Esteve Microelectronics Reliability 49 (9-11), 1304-1308, 2009 | 13 | 2009 |
| Backside laser testing of single-event effects in GaN-on-si power HEMTs C Ngom, V Pouget, M Zerarka, F Coccetti, A Touboul, M Matmat, O Crepel, ... IEEE Transactions on Nuclear Science 68 (8), 1642-1650, 2021 | 10 | 2021 |
| Damage detection in composite laminates aeronautics structures through accelerometers network S Ksouri, M Matmat, H Boukabache, C Escriba, J Fourniols Advances in Materials Science 11 (2), 37-43, 2011 | 10 | 2011 |
| Sensors/actuators network development for aeronautics structure health monitoring H Boukabache, M Matmat, C Escriba, JY Fourniols SENSORS, 2011 IEEE, 1157-1160, 2011 | 8 | 2011 |
| Thermo-electro-mechanical V-shaped actuator design and simulations M Matmat, M Al Ahmad, C Escriba, S Soulimane, A Marty, JY Fourniols EuroSimE 2008-International Conference on Thermal, Mechanical and Multi …, 2008 | 5 | 2008 |
| Piezoelectric wafer active sensor network for aircraft structures damage localisation: pitch-catch method H Boukabache, M Matmat, S KSOURI, C ESCRIBA, JY FOURNIOLS Structural Health Monitoring 2011, 2011 | 4 | 2011 |
| Modelling of charge injection by multi-photon absorption in GaN-on-Si HEMTs for SEE testing C Ngom, V Pouget, M Zerarka, F Coccetti, O Crepel, A Touboul, M Matmat Microelectronics Reliability 126, 114339, 2021 | 2 | 2021 |
| Modeling of smart compliant electro-active polymer actuator S Soulimane, M Al Ahmad, M Matmat, H Camon EuroSimE 2008-International Conference on Thermal, Mechanical and Multi …, 2008 | 2 | 2008 |
| Perspectives of Thermo-electro-mechanical Micro actuators for micro switch Applications: Design and Simulation M Matmat, M Al Ahmad, JY Fourniols COMSOL Conference, 2007 | 2 | 2007 |
| A methodology for reliability prediction: Thermal and RF MEMS case of studies M Matmat, H Boukabache, A Marty, D Esteve, C Escriba, JY Fourniols SENSORS, 2011 IEEE, 1677-1680, 2011 | 1 | 2011 |
| Worst Case Heavy Ion Testing Conditions for Normally Off GaN-Based High Electron Mobility Transistor JB Sauveplane, C Chabot, C Ngom, M Orsatelli, A Guttierez-Galeano, ... European Conference on Radiation and its Effects on Components and Systems …, 2023 | | 2023 |
| Laser-induced Transients in a GaN-on-Si Power HEMT using Si-SPA Optical Parameters C Ngom, V Pouget, M Zerarka, F Coccetti, A Touboul, M Matmat, O Crepel 2021 21th European Conference on Radiation and Its Effects on Components and …, 2021 | | 2021 |
| The RADECS 2020 Awards C Ngom, V Pouget, M Zerarka, F Coccetti, A Touboul, M Matmat, O Crepel, ... | | |
