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Leonard Hayden
Leonard Hayden
Qorvo
Adresse e-mail validée de rfprobing.com
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Multimode TRL. A new concept in microwave measurements: theory and experimental verification
C Seguinot, P Kennis, JF Legier, F Huret, E Paleczny, L Hayden
IEEE Transactions on Microwave Theory and Techniques 46 (5), 536-542, 1998
2111998
An SOLR calibration for accurate measurement of orthogonal on-wafer DUTs
S Basu, L Hayden
1997 IEEE MTT-S International Microwave Symposium Digest 3, 1335-1338, 1997
1471997
Probe for combined signals
L Hayden, S Rumbaugh, M Andrews
US Patent 6,724,205, 2004
1062004
Probe for combined signals
L Hayden, S Rumbaugh, M Andrews
US Patent 6,806,724, 2004
992004
Probe for combined signals
L Hayden, S Rumbaugh, M Andrews
US Patent 7,046,023, 2006
932006
An enhanced line-reflect-reflect-match calibration
L Hayden
2006 67th ARFTG Conference, 143-149, 2006
902006
A Multi-Line TRL Calibration
L Hayden
Feb 2, 5, 1994
731994
Probe for testing a device under test
KR Gleason, T Lesher, EW Strid, M Andrews, J Martin, J Dunklee, ...
US Patent 6,815,963, 2004
692004
Characterization and modeling of multiple line interconnections from time domain measurements
LA Hayden, VK Tripathi
IEEE Transactions on Microwave Theory and Techniques 42 (9), 1737-1743, 1994
691994
A complete multimode equivalent-circuit theory for electrical design
DF Williams, LA Hayden, RB Marks
Journal of Research of the National Institute of Standards and Technology …, 1997
671997
Probe station having inner and outer shielding
RA Peters, LA Hayden, JA Hawkins, RM Dougherty
US Patent 6,002,263, 1999
631999
Calibration methods for time domain network analysis
LA Hayden, VK Tripathi
IEEE Transactions on Microwave Theory and Techniques 41 (3), 415-420, 1993
561993
Probe station having multiple enclosures
RA Peters, LA Hayden, JA Hawkins, RM Dougherty
US Patent 6,362,636, 2002
552002
Probe station having multiple enclosures
RA Peters, LA Hayden, JA Hawkins, RM Dougherty
US Patent 6,842,024, 2005
542005
Probe station having multiple enclosures
RA Peters, LA Hayden, JA Hawkins, RM Dougherty
US Patent 6,639,415, 2003
502003
Probe station having multiple enclosures
RA Peters, LA Hayden, JA Hawkins, RM Dougherty
US Patent 6,489,789, 2002
502002
Nonuniformly coupled microstrip transversal filters for analog signal processing
LA Hayden, VK Tripathi
IEEE transactions on microwave theory and techniques 39 (1), 47-53, 1991
501991
Sensitivity analysis of calibration standards for SOLT and LRRM
AME Safwat, L Hayden
58th ARFTG Conference Digest 40, 1-10, 2001
492001
Probe for testing a device under test
KR Gleason, T Lesher, EW Strid, M Andrews, J Martin, J Dunklee, ...
US Patent 7,161,363, 2007
48*2007
Probe station having multiple enclosures
RA Peters, LA Hayden, JA Hawkins, RM Dougherty
US Patent 7,626,379, 2009
402009
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