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Tobias Schülli
Tobias Schülli
ESRF Scientist in charge of Beamline ID01; Deputy Group Head of the X-ray Nanoprobe group
Verified email at esrf.fr - Homepage
Title
Cited by
Cited by
Year
Shape changes of supported Rh nanoparticles during oxidation and reduction cycles
P Nolte, A Stierle, NY Jin-Phillipp, N Kasper, TU Schulli, H Dosch
Science 321 (5896), 1654-1658, 2008
2452008
Direct determination of strain and composition profiles in SiGe islands by anomalous x-ray diffraction at high momentum transfer
TU Schülli, J Stangl, Z Zhong, RT Lechner, M Sztucki, TH Metzger, ...
Physical review letters 90 (6), 066105, 2003
1622003
Liquid-phase sintering of lead halide perovskites and metal-organic framework glasses
J Hou, P Chen, A Shukla, A Krajnc, T Wang, X Li, R Doasa, LHG Tizei, ...
Science 374 (6567), 621-625, 2021
1592021
Substrate-enhanced supercooling in AuSi eutectic droplets
TU Schülli, R Daudin, G Renaud, A Vaysset, O Geaymond, A Pasturel
Nature 464 (7292), 1174-1177, 2010
1582010
Faster Activation and Slower Capacity/Voltage Fading: A Bifunctional Urea Treatment on Lithium‐Rich Cathode Materials
T Lin, TU Schulli, Y Hu, X Zhu, Q Gu, B Luo, B Cowie, L Wang
Advanced Functional Materials, 1909192, 2020
1432020
Identifying copper vacancies and their role in the CuO based photocathode for water splitting
Z Wang, L Zhang, TU Schülli, Y Bai, SA Monny, A Du, L Wang
Angewandte Chemie 131 (49), 17768-17773, 2019
1322019
Imaging of strain and lattice orientation by quick scanning X-ray microscopy combined with three-dimensional reciprocal space mapping
GA Chahine, MI Richard, RA Homs-Regojo, TN Tran-Caliste, D Carbone, ...
Journal of Applied Crystallography 47 (2), 762-769, 2014
1272014
Enhanced relaxation and intermixing in Ge islands grown on pit-patterned Si (001) substrates
TU Schülli, G Vastola, MI Richard, A Malachias, G Renaud, F Uhlík, ...
Physical review letters 102 (2), 025502, 2009
992009
Interface aspects in all‐solid‐state Li‐based batteries reviewed
C Chen, M Jiang, T Zhou, L Raijmakers, E Vezhlev, B Wu, TU Schülli, ...
Advanced energy materials 11 (13), 2003939, 2021
912021
Surface phase transitions in BiFeO below room temperature
R Jarrier, X Marti, J Herrero-Albillos, P Ferrer, R Haumont, P Gemeiner, ...
Physical Review B 85 (18), 184104, 2012
872012
Inversion domain boundaries in GaN wires revealed by coherent Bragg imaging
S Labat, MI Richard, M Dupraz, M Gailhanou, G Beutier, M Verdier, ...
ACS nano 9 (9), 9210-9216, 2015
782015
Influence of growth temperature on interdiffusion in uncapped SiGe-islands on Si (001) determined by anomalous x-ray diffraction and reciprocal space mapping
TU Schülli, M Stoffel, A Hesse, J Stangl, RT Lechner, E Wintersberger, ...
Physical Review B 71 (3), 035326, 2005
762005
Strain distribution in nitride quantum dot multilayers
V Chamard, T Schülli, M Sztucki, TH Metzger, E Sarigiannidou, ...
Physical Review B 69 (12), 125327, 2004
722004
The Nanodiffraction beamline ID01/ESRF: a microscope for imaging strain and structure
SJ Leake, GA Chahine, H Djazouli, T Zhou, C Richter, J Hilhorst, L Petit, ...
Journal of synchrotron radiation 26 (2), 571-584, 2019
712019
Growth Mechanism and Surface State of CuInS2 Nanocrystals Synthesized with Dodecanethiol
M Gromova, A Lefrançois, L Vaure, F Agnese, D Aldakov, A Maurice, ...
Journal of the American Chemical Society 139 (44), 15748-15759, 2017
672017
Intergrowth structure and aluminium zoning of a zeolite ZSM‐5 crystal as resolved by synchrotron‐based micro x‐ray diffraction imaging
Z Ristanović, JP Hofmann, U Deka, TU Schülli, M Rohnke, AM Beale, ...
Angewandte Chemie 125 (50), 13624-13628, 2013
662013
X-ray diffraction from rectangular slits
L Bolloc'h, F Livet, F Bley, T Schulli, M Veron, TH Metzger
Journal of Synchrotron Radiation 9 (4), 258-265, 2002
542002
X-ray study of atomic ordering in self-assembled Ge islands grown on Si (001)
A Malachias, TU Schülli, G Medeiros-Ribeiro, LG Cançado, M Stoffel, ...
Physical Review B 72 (16), 165315, 2005
532005
Crystal phase transitions in the shell of PbS/CdS core/shell nanocrystals influences photoluminescence intensity
RT Lechner, G Fritz-Popovski, M Yarema, W Heiss, A Hoell, TU Schülli, ...
Chemistry of materials 26 (20), 5914-5922, 2014
522014
Nanoscale Distortions of Si Quantum Wells in Si/SiGe Quantum‐Electronic Heterostructures
PG Evans, DE Savage, JR Prance, CB Simmons, MG Lagally, ...
Advanced Materials 24 (38), 5217-5221, 2012
492012
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