Sergiu Viorel Spataru
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On the perturb-and-observe and incremental conductance MPPT methods for PV systems
D Sera, L Mathe, T Kerekes, SV Spataru, R Teodorescu
IEEE journal of photovoltaics 3 (3), 1070-1078, 2013
Diagnostic method for photovoltaic systems based on light I–V measurements
S Spataru, D Sera, T Kerekes, R Teodorescu
Solar Energy 119, 29-44, 2015
Accelerated testing and modeling of potential-induced degradation as a function of temperature and relative humidity
P Hacke, S Spataru, K Terwilliger, G Perrin, S Glick, S Kurtz, ...
IEEE Journal of Photovoltaics 5 (6), 1549-1553, 2015
Comparative Study of Ramp-Rate Control Algorithms for PV with Energy Storage Systems
J Martins, S Spataru, D Sera, DI Stroe, A Lashab
Energies 12 (7), 1342, 2019
A Direct Maximum Power Point Tracking Method for Single-Phase Grid-Connected PV Inverters
F El Aamri, H Maker, D Sera, SV Spataru, JM Guerrero, A Mouhsen
IEEE Transactions on Power Electronics 33 (10), 8961-8971, 2018
Automatic detection and evaluation of solar cell micro-cracks in electroluminescence images using matched filters
S Spataru, P Hacke, D Sera
2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC), 1602-1607, 2016
Temperature‐dependency analysis and correction methods of in situ power‐loss estimation for crystalline silicon modules undergoing potential‐induced …
S Spataru, P Hacke, D Sera, C Packard, T Kerekes, R Teodorescu
Progress in Photovoltaics: Research and Applications 23 (11), 1536-1549, 2015
Detection of increased series losses in PV arrays using Fuzzy Inference Systems
S Spataru, D Sera, T Kerekes, R Teodorescu
2012 38th IEEE Photovoltaic Specialists Conference, 000464-000469, 2012
Drone-based daylight electroluminescence imaging of PV modules
GA dos Reis Benatto, C Mantel, S Spataru, AAS Lancia, N Riedel, ...
IEEE Journal of Photovoltaics 10 (3), 872-877, 2020
Complete methodology on generating realistic wind speed profiles based on measurements
C Gavriluta, S Spataru, I Mosincat, C Citro, I Candela, P Rodriguez
International conference on renewable energies and power quality 1, 1757-1762, 2012
Advancing reliability assessments of photovoltaic modules and materials using combined‐accelerated stress testing
M Owen‐Bellini, P Hacke, DC Miller, MD Kempe, S Spataru, T Tanahashi, ...
Progress in Photovoltaics: Research and Applications 29 (1), 64-82, 2021
Multiple-power-sample based P&O MPPT for fast-changing irradiance conditions for a simple implementation
H Abouadane, A Fakkar, D Sera, A Lashab, S Spataru, T Kerekes
IEEE Journal of Photovoltaics 10 (5), 1481-1488, 2020
Photovoltaic array condition monitoring based on online regression of performance model
S Spataru, D Sera, T Kerekes, R Teodorescu
2013 IEEE 39th Photovoltaic Specialists Conference (PVSC), 0815-0820, 2013
Quantifying solar cell cracks in photovoltaic modules by electroluminescence imaging
S Spataru, P Hacke, D Sera, S Glick, T Kerekes, R Teodorescu
2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC), 1-6, 2015
Combined-Accelerated Stress Testing System for Photovoltaic Modules
S Spataru, P Hacke, M Owen-Bellini
2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC)(A …, 2018
Fault identification in crystalline silicon PV modules by complementary analysis of the light and dark current–voltage characteristics
SV Spataru, D Sera, P Hacke, T Kerekes, R Teodorescu
Progress in Photovoltaics: Research and Applications 24 (4), 517-532, 2016
Combined and Sequential Accelerated Stress Testing for Derisking Photovoltaic Modules
P Hacke, M Owen-Bellini, M Kempe, DC Miller, T Tanahashi, K Sakurai, ...
Advanced Micro-and Nanomaterials for Photovoltaics, 279-313, 2019
Combined-accelerated stress testing for advanced reliability assessment of photovoltaic modules
M Owen-Bellini, P Hacke, D Kern, D Miller, M Kempe, S Spataru, H North
National Renewable Energy Lab.(NREL), Golden, CO (United States), 2020
Machine learning prediction of defect types for electroluminescence images of photovoltaic panels
C Mantel, F Villebro, GA dos Reis Benatto, HR Parikh, S Wendlandt, ...
Applications of Machine Learning 11139, 1113904, 2019
Elucidating PID degradation mechanisms and in situ dark I–V monitoring for modeling degradation rate in CdTe thin-film modules
P Hacke, S Spataru, S Johnston, K Terwilliger, K VanSant, M Kempe, ...
IEEE Journal of Photovoltaics 6 (6), 1635-1640, 2016
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