| Behavior of electron-irradiation-induced defects in GaAs D Stievenard, X Boddaert, JC Bourgoin, HJ Von Bardeleben Physical Review B 41 (8), 5271, 1990 | 154 | 1990 |
| Irradiation-induced defects in p-type GaAs D Stievenard, X Boddaert, JC Bourgoin Physical Review B 34 (6), 4048, 1986 | 127 | 1986 |
| Inkjet printing of high molecular weight PVDF-TrFE for flexible electronics RI Haque, R Vié, M Germainy, L Valbin, P Benaben, X Boddaert Flexible and Printed Electronics 1 (1), 015001, 2015 | 97 | 2015 |
| Fabrication of capacitive acoustic resonators combining 3D printing and 2D inkjet printing techniques RI Haque, E Ogam, C Loussert, P Benaben, X Boddaert Sensors 15 (10), 26018-26038, 2015 | 34 | 2015 |
| Ge2Sb2Te5 layer used as solid electrolyte in conductive-bridge memory devices fabricated on flexible substrate D Deleruyelle, M Putero, T Ouled-Khachroum, M Bocquet, MV Coulet, ... Solid-State Electronics 79, 159-165, 2013 | 32 | 2013 |
| Reliability of OTFTs on flexible substrate: mechanical stress effect B Bensaid, X Boddaert, P Benaben, R Gwoziecki, R Coppard The European Physical Journal-Applied Physics 55 (2), 23907, 2011 | 31 | 2011 |
| Characterization of organic ultra-thin film adhesion on flexible substrate using scratch test technique G Covarel, B Bensaid, X Boddaert, S Giljean, P Benaben, P Louis Surface and Coatings Technology 211, 138-142, 2012 | 26 | 2012 |
| New qualification approach for optoelectronic components JL Goudard, P Berthier, X Boddaert, D Laffitte, J Périnet Microelectronics Reliability 42 (9-11), 1307-1310, 2002 | 17 | 2002 |
| Organic ultrathin film adhesion on compliant substrate using scratch test technique X Boddaert, G Covarel, B Bensaid, M Mattei, P Benaben, J Bois Thin Solid Films 528, 194-198, 2013 | 16 | 2013 |
| Ellipsometry study of process deposition of amorphous Indium Gallium Zinc Oxide sputtered thin films C Talagrand, X Boddaert, DG Selmeczi, C Defranoux, P Collot Thin Solid Films 590, 134-140, 2015 | 12 | 2015 |
| Optimization of capacitive acoustic resonant sensor using numerical simulation and design of experiment RI Haque, C Loussert, M Sergent, P Benaben, X Boddaert Sensors 15 (4), 8945-8967, 2015 | 10 | 2015 |
| Inkjet-printed membrane for a capacitive acoustic sensor: Development and characterization using laser vibrometer RI Haque, E Ogam, P Benaben, X Boddaert Sensors 17 (5), 1056, 2017 | 9 | 2017 |
| RFID tags for cryogenic applications: Experimental and numerical analysis of thermo-mechanical behaviour R Cauchois, MS Yin, A Gouantes, X Boddaert Microelectronics Reliability 53 (6), 885-891, 2013 | 9 | 2013 |
| Auger regeneration of the EL2 defect induced by the Debye tail in the space-charge region of a junction: Application to the so-called ‘‘optical regeneration’’ X Boddaert, D Stievenard, JC Bourgoin Physical Review B 40 (2), 1051, 1989 | 8 | 1989 |
| Textile Electronic Circuits from Laser‐Patterned Conductive Fabric V Gaubert, X Boddaert, T Djenizian, R Delattre Advanced Engineering Materials 25 (9), 2201548, 2023 | 6 | 2023 |
| Mechanical and thermal reliability of printed organic thin-film transistor X Boddaert, B Bensaid, P Benaben, R Gwoziecki, R Coppard Microelectronics Reliability 50 (9-11), 1884-1887, 2010 | 6 | 2010 |
| Numerical investigations of smart card module: Parametric analysis and design optimization M Su, X Boddaert, K Inal IEEE Transactions on Device and Materials Reliability 8 (3), 464-470, 2008 | 6 | 2008 |
| Evaluation of probing process parameters and pad designs: experiments and modelling correlations for solving mechanical issues R Roucou, V Fiori, F Cacho, K Inal, X Boddaert 2010 11th International Thermal, Mechanical & Multi-Physics Simulation, and …, 2010 | 5 | 2010 |
| New qualification approaches for opto-electronic devices P Berthier, D Laffitte, J Perinet, JL Goudard, X Boddaert, P Chazan 52nd Electronic Components and Technology Conference 2002.(Cat. No …, 2002 | 5 | 2002 |
| andH. J. von Bardeleben D Stiévenard, X Boddaert, JC Bourgoin Phys. Rev. B 41, 5271, 1990 | 4 | 1990 |
