Xavier Boddaert
Xavier Boddaert
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TitreCitée parAnnée
Behavior of electron-irradiation-induced defects in GaAs
D Stievenard, X Boddaert, JC Bourgoin, HJ Von Bardeleben
Physical Review B 41 (8), 5271, 1990
1311990
Irradiation-induced defects in p-type GaAs
D Stievenard, X Boddaert, JC Bourgoin
Physical Review B 34 (6), 4048, 1986
1041986
Inkjet printing of high molecular weight PVDF-TrFE for flexible electronics
RI Haque, R Vié, M Germainy, L Valbin, P Benaben, X Boddaert
Flexible and Printed Electronics 1 (1), 015001, 2015
282015
Reliability of OTFTs on flexible substrate: mechanical stress effect
B Bensaid, X Boddaert, P Benaben, R Gwoziecki, R Coppard
The European Physical Journal-Applied Physics 55 (2), 2011
222011
Ge2Sb2Te5 layer used as solid electrolyte in conductive-bridge memory devices fabricated on flexible substrate
D Deleruyelle, M Putero, T Ouled-Khachroum, M Bocquet, MV Coulet, ...
Solid-State Electronics 79, 159-165, 2013
162013
New qualification approach for optoelectronic components
JL Goudard, P Berthier, X Boddaert, D Laffitte, J Périnet
Microelectronics Reliability 42 (9-11), 1307-1310, 2002
152002
Fabrication of capacitive acoustic resonators combining 3D printing and 2D inkjet printing techniques
R Haque, E Ogam, C Loussert, P Benaben, X Boddaert
Sensors 15 (10), 26018-26038, 2015
142015
Characterization of organic ultra-thin film adhesion on flexible substrate using scratch test technique
G Covarel, B Bensaid, X Boddaert, S Giljean, P Benaben, P Louis
Surface and Coatings Technology 211, 138-142, 2012
132012
Auger regeneration of the EL2 defect induced by the Debye tail in the space-charge region of a junction: Application to the so-called ‘‘optical regeneration’’
X Boddaert, D Stievenard, JC Bourgoin
Physical Review B 40 (2), 1051, 1989
101989
Organic ultrathin film adhesion on compliant substrate using scratch test technique
X Boddaert, G Covarel, B Bensaid, M Mattei, P Benaben, J Bois
Thin Solid Films 528, 194-198, 2013
92013
Ellipsometry study of process deposition of amorphous Indium Gallium Zinc Oxide sputtered thin films
C Talagrand, X Boddaert, DG Selmeczi, C Defranoux, P Collot
Thin Solid Films 590, 134-140, 2015
82015
Numerical investigations of smart card module: Parametric analysis and design optimization
M Su, X Boddaert, K Inal
IEEE Transactions on Device and Materials Reliability 8 (3), 464-470, 2008
62008
andH. J. von Bardeleben
D Stievenard, X Boddaert, JC Bourgoin
Phys. Rev. B 41, 5271, 1990
61990
Optimization of capacitive acoustic resonant sensor using numerical simulation and design of experiment
R Haque, C Loussert, M Sergent, P Benaben, X Boddaert
Sensors 15 (4), 8945-8967, 2015
52015
RFID tags for cryogenic applications: experimental and numerical analysis of thermo-mechanical behaviour
R Cauchois, MS Yin, A Gouantes, X Boddaert
Microelectronics Reliability 53 (6), 885-891, 2013
52013
Mechanical and thermal reliability of printed organic thin-film transistor
X Boddaert, B Bensaid, P Benaben, R Gwoziecki, R Coppard
Microelectronics Reliability 50 (9-11), 1884-1887, 2010
52010
Evaluation of probing process parameters and pad designs: experiments and modelling correlations for solving mechanical issues
R Roucou, V Fiori, F Cacho, K Inal, X Boddaert
2010 11th International Thermal, Mechanical & Multi-Physics Simulation, and …, 2010
42010
Inkjet-Printed Membrane for a Capacitive Acoustic Sensor: Development and Characterization Using Laser Vibrometer
R Haque, E Ogam, P Benaben, X Boddaert
Sensors 17 (5), 1056, 2017
32017
New qualification approaches for opto-electronic devices
P Berthier, D Laffitte, J Perinet, JL Goudard, X Boddaert, P Chazan
52nd Electronic Components and Technology Conference 2002.(Cat. No …, 2002
32002
Deep‐UV antireflective coating: ellipsometry and XPS characterization
X Boddaert, A Caramante, E Josse, B Delahaye
Surface and Interface Analysis: An International Journal devoted to the …, 2000
22000
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