Suivre
Hyungcheol Shin
Hyungcheol Shin
Seoul National University, Department of Electrical and Computer Engineering
Adresse e-mail validée de snu.ac.kr - Page d'accueil
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Three-dimensional NAND flash architecture design based on single-crystalline stacked array
Y Kim, JG Yun, SH Park, W Kim, JY Seo, M Kang, KC Ryoo, JH Oh, ...
IEEE Transactions on Electron Devices 59 (1), 35-45, 2011
2352011
Single-crystalline Si stacked array (STAR) NAND flash memory
JG Yun, G Kim, JE Lee, Y Kim, WB Shim, JH Lee, H Shin, JD Lee, ...
IEEE Transactions on Electron Devices 58 (4), 1006-1014, 2011
1942011
A simple and analytical parameter-extraction method of a microwave MOSFET
I Kwon, M Je, K Lee, H Shin
IEEE Transactions on Microwave Theory and Techniques 50 (6), 1503-1509, 2002
1662002
A simple wide-band on-chip inductor model for silicon-based RF ICs
J Gil, H Shin
IEEE Transactions on Microwave Theory and Techniques 51 (9), 2023-2028, 2003
1512003
Fabrication and room-temperature characterization of a silicon self-assembled quantum-dot transistor
BH Choi, SW Hwang, IG Kim, HC Shin, Y Kim, EK Kim
Applied Physics Letters 73 (21), 3129-3131, 1998
1401998
Analytical drain thermal noise current model valid for deep submicron MOSFETs
K Han, H Shin, K Lee
IEEE Transactions on Electron Devices 51 (2), 261-269, 2004
1202004
Thin gate oxide damage due to plasma processing
HC Shin, C Hu
Semiconductor Science and Technology 11 (4), 463, 1996
1181996
Flash memory element and manufacturing method thereof
JH Lee, HC Shin
US Patent 6,768,158, 2004
1142004
Room temperature single electron effects in a Si nano-crystal memory
I Kim, S Han, K Han, J Lee, H Shin
IEEE Electron Device Letters 20 (12), 630-631, 1999
961999
Characteristics of p-channel Si nano-crystal memory
K Han, I Kim, H Shin
IEEE Transactions on Electron Devices 48 (5), 874-879, 2001
902001
Complete high-frequency thermal noise modeling of short-channel MOSFETs and design of 5.2-GHz low noise amplifier
K Han, J Gil, SS Song, J Han, H Shin, CK Kim, K Lee
IEEE Journal of Solid-State Circuits 40 (3), 726-735, 2005
862005
Plasma etching charge-up damage to thin oxides
H Shin, N Jha, Q Xue-Yu, GW Hills, C Hu
Solid State Technology 36 (8), 29-35, 1993
811993
A simple parameter extraction method of spiral on-chip inductors
M Kang, J Gil, H Shin
IEEE Transactions on Electron Devices 52 (9), 1976-1981, 2005
802005
Non-quasi-static small-signal modeling and analytical parameter extraction of SOI FinFETs
IM Kang, H Shin
IEEE transactions on nanotechnology 5 (3), 205-210, 2006
792006
Modeling oxide thickness dependence of charging damage by plasma processing
H Shin, K Noguchi, C Hu
IEEE electron device letters 14 (11), 509-511, 1993
781993
Thin oxide damage by plasma etching and ashing processes
H Shin, C King, C Hu
30th Annual Proceedings Reliability Physics 1992, 37-41, 1992
781992
Electron trap density distribution of Si-rich silicon nitride extracted using the modified negative charge decay model of silicon-oxide-nitride-oxide-silicon structure at …
TH Kim, IH Park, JD Lee, HC Shin, BG Park
Applied physics letters 89 (6), 063508, 2006
732006
Analysis of floating body induced transient behaviors in partially depleted thin film SOI devices
HC Shin, IS Lim, M Racanelli, WLM Huang, J Foerstner, BY Hwang
IEEE Transactions on Electron Devices 43 (2), 318-325, 1996
691996
A silicon quantum wire transistor with one-dimensional subband effects
M Je, S Han, I Kim, H Shin
Solid-State Electronics 44 (12), 2207-2212, 2000
662000
Characterization of oxide traps leading to RTN in high-k and metal gate MOSFETs
S Lee, HJ Cho, Y Son, DS Lee, H Shin
2009 IEEE International Electron Devices Meeting (IEDM), 1-4, 2009
652009
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