Nicolas R. Vaxelaire
Nicolas R. Vaxelaire
Research Scientist, Univ. Grenoble Alpes, CEA, LETI
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Cited by
Cited by
Dislocation storage in single slip-oriented Cu micro-tensile samples: new insights via X-ray microdiffraction
C Kirchlechner, D Kiener, C Motz, S Labat, N Vaxelaire, O Perroud, ...
Philosophical Magazine 91 (7-9), 1256-1264, 2011
Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction
N Vaxelaire, H Proudhon, S Labat, C Kirchlechner, J Keckes, V Jacques, ...
New Journal of Physics 12 (3), 035018, 2010
Correlation between electric-field-induced phase transition and piezoelectricity in lead zirconate titanate films
V Kovacova, N Vaxelaire, G Le Rhun, P Gergaud, T Schmitz-Kempen, ...
Physical Review B 90 (14), 140101, 2014
Evolution of surface roughness in silicon X-ray mirrors exposed to a low-energy ion beam
E Ziegler, L Peverini, N Vaxelaire, A Cordon-Rodriguez, A Rommeveaux, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2010
Sub-micrometre depth-gradient measurements of phase, strain and texture in polycrystalline thin films: a nano-pencil beam diffraction approach
N Vaxelaire, P Gergaud, GBM Vaughan
Journal of Applied Crystallography 47 (2), 495-504, 2014
Demonstration of BEOL-compatible ferroelectric Hf0.5Zr0.5O2 scaled FeRAM co-integrated with 130nm CMOS for embedded NVM applications
T Francois, L Grenouillet, J Coignus, P Blaise, C Carabasse, N Vaxelaire, ...
2019 IEEE International Electron Devices Meeting (IEDM), 15.7. 1-15.7. 4, 2019
New insights into single-grain mechanical behavior from temperature-dependent 3-D coherent X-ray diffraction
N Vaxelaire, S Labat, TW Cornelius, C Kirchlechner, J Keckes, T Schulli, ...
Acta materialia 78, 46-55, 2014
Actuation efficiency of polyvinylidene fluoride-based co-and ter-polymers
P Lheritier, S Noel, N Vaxelaire, FD Dos Santos, E Defay
Polymer 156, 270-275, 2018
Finite element simulations of coherent diffraction in elastoplastic polycrystalline aggregates
H Proudhon, N Vaxelaire, S Labat, S Forest, O Thomas
Comptes Rendus Physique 11 (3-4), 293-303, 2010
3D strain imaging in sub-micrometer crystals using cross-reciprocal space measurements: Numerical feasibility and experimental methodology
N Vaxelaire, S Labat, V Chamard, O Thomas, V Jacques, F Picca, S Ravy, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2010
In situ 2D diffraction as a tool to characterize ferroelectric and piezoelectric thin films
NI Khamidy, V Kovacova, A Bernasconi, G Le Rhun, N Vaxelaire
Materials Research Express 4 (8), 084002, 2017
Determination of shape anisotropy in embedded low contrast submonolayer quantum dot structures
S Dhomkar, N Vaxelaire, H Ji, V Shuvayev, MC Tamargo, IL Kuskovsky, ...
Applied Physics Letters 107 (25), 251905, 2015
Improvement of HfO2based RRAM array performances by local Si implantation
M Barlas, A Grossi, L Grenouillet, E Vianello, E Nolot, N Vaxelaire, ...
2017 IEEE International Electron Devices Meeting (IEDM), 14.6.1-14.6.4., 2018
Effect of structural in-depth heterogeneities on electrical properties of Pb(Zr0.52Ti0.48) O3 thin films as revealed by nano-beam X-ray diffraction
N Vaxelaire, V Kovacova, A Bernasconi, G Le Rhun, M Alvarez-Murga, ...
Journal of Applied Physics 120 (10), 104101, 2016
Microstructural and chemical analysis of polycrystalline LiNbO3 films obtained by room-temperature RF sputtering after various annealing durations
LC Sauze, N Vaxelaire, D Rouchon, F Pierre, R Templier, D Remiens, ...
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 38 (4 …, 2020
Impact of area scaling on the ferroelectric properties of back-end of line compatible Hf0.5Zr0.5O2 and Si:HfO2-based MFM capacitors
T Francois, L Grenouillet, J Coignus, N Vaxelaire, C Carabasse, ...
Applied Physics Letters 118 (6), 062904, 2021
Performance assessment of BEOL-integrated HfO2-based ferroelectric capacitors for FeRAM memory arrays
L Grenouillet, T Francois, J Coignus, N Vaxelaire, C Carabasse, F Triozon, ...
2020 IEEE Silicon Nanoelectronics Workshop (SNW), 5-6, 2020
Nanosecond Laser Anneal (NLA) for Si-implanted HfO2 Ferroelectric Memories Integrated in Back-End Of Line (BEOL)
L Grenouillet, T Francois, J Coignus, S Kerdilès, N Vaxelaire, ...
2020 IEEE Symposium on VLSI Technology, 1-2, 2020
In-situ X-ray diffraction on functional thin films using a laboratory source during electrical biasing
B Allouche, I Gueye, G Le Rhun, P Gergaud, N Vaxelaire
Materials & Design 154, 340-346, 2018
Etude des inhomogénéités de déformation dans les films minces polycristallins par diffraction X cohérente
N Vaxelaire
Université Paul Cézanne-Aix-Marseille III, 2011
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