Zeno Schumacher
Zeno Schumacher
Department of Physics, ETH Zurich
Verified email at phys.ethz.ch
Title
Cited by
Cited by
Year
Measurement of surface photovoltage by atomic force microscopy under pulsed illumination
Z Schumacher, Y Miyahara, A Spielhofer, P Grutter
Physical Review Applied 5 (4), 044018, 2016
312016
The limit of time resolution in frequency modulation atomic force microscopy by a pump-probe approach
Z Schumacher, A Spielhofer, Y Miyahara, P Grutter
Applied Physics Letters 110 (5), 053111, 2017
282017
Kelvin probe force microscopy by dissipative electrostatic force modulation
Y Miyahara, J Topple, Z Schumacher, P Grutter
Physical Review Applied 4 (5), 054011, 2015
202015
Improved atomic force microscopy cantilever performance by partial reflective coating
Z Schumacher, Y Miyahara, L Aeschimann, P Grütter
Beilstein journal of nanotechnology 6 (1), 1450-1456, 2015
82015
Phase stabilization of an attosecond beamline combining two IR colors
F Schlaepfer, M Volkov, N Hartmann, A Niedermayr, Z Schumacher, ...
Optics express 27 (16), 22385-22392, 2019
72019
Ultrafast nuclear dynamics of the acetylene cation C 2 H 2+ and its impact on the infrared probe pulse induced C–H bond breaking efficiency
N Hartmann, S Bhattacharyya, F Schlaepfer, M Volkov, Z Schumacher, ...
Physical Chemistry Chemical Physics 21 (33), 18380-18385, 2019
32019
Nanoscale force sensing of an ultrafast nonlinear optical response
Z Schumacher, R Rejali, R Pachlatko, A Spielhofer, P Nagler, Y Miyahara, ...
Proceedings of the National Academy of Sciences 117 (33), 19773-19779, 2020
12020
Time-domain Kelvin probe force microscopy for local ultra-fast decay time measurements
Z Schumacher
12016
Microfluidic impedance spectroscopy scanner for spherical microtissues
Z Schumacher, O Frey, A Hierlemann
Proceedings of 15th International Conference on Miniaturized Systems for …, 2011
12011
Charge carrier inversion in a doped thin film organic semiconductor island
Z Schumacher, R Rejali, A Spielhofer, Y Miyahara, P Grutter
arXiv preprint arXiv:2008.01562, 2020
2020
Ultrafast AFM: sub-femtosecond time resolution at the nanometer scale
P Grutter, Z Schumacher, R Rejali, R Pachlatko, A Spielhofer, Y Miyahara
APS March Meeting Abstracts 2018, E01. 008, 2018
2018
Sensitivity measurement of a cantilever-based surface stress sensor
AL Haag, Z Schumacher, P Grutter
The Journal of chemical physics 145 (15), 154704, 2016
2016
The lower limit for time resolution in frequency modulation atomic force microscopy
Z Schumacher, A Spielhofer, Y Miyahara, P Grutter
arXiv preprint arXiv:1609.02362, 2016
2016
Time-domain kelvin probe force microscopy for fast time scale measurements
Z SCHUMACHER, Y MIYAHARA, P GRUTTER
한국진공학회 학술발표회초록집, 120-120, 2016
2016
Atomic force microscopy using correlated probe oscillation and probe-sample bias voltage
JM Topple, Y Miyahara, PH Grutter, Z Schumacher
US Patent App. 14/231,885, 2015
2015
Photovoltaics at the nanoscale
Z Schumacher, J Topple, A Tekiel, P Grütter
Physical Chemistry of Interfaces and Nanomaterials XII 8811, 881116, 2013
2013
Microfluidic approaches and impedance spectroscopy for screening of spherical microtissues
O Frey, Z Schumacher, A Hierlemann
3D Cell Culture 2012: Advanced Model Systems, Application & Enabling …, 2012
2012
Understanding Photoionization Induced Hydrogen Abstraction of Acetylene Through Nonadiabatic Molecular Dynamics Simulations
S Bhattacharyya, N Hartmann, F Schlaepfer, M Volkov, Z Schumacher, ...
Tutorial Speakers, 14, 0
Supporting Information for Improved atomic force microscopy cantilever performance by partial reflective coating
Z Schumacher, Y Miyaharaa, L Aeschimann, P Grütter
Small Molecule Organic Photovoltaics at the Nanoscale
JM Topple, Z Schumacher, P Grütter
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Articles 1–20