Guillaume Hubert
Guillaume Hubert
ONERA, the French Aerospace Lab.
Adresse e-mail validée de onera.fr
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Device simulation study of the SEU sensitivity of SRAMs to internal ion tracks generated by nuclear reactions
JM Palau, G Hubert, K Coulie, B Sagnes, MC Calvet, S Fourtine
IEEE Transactions on Nuclear Science 48 (2), 225-231, 2001
1182001
Operational SER Calculations on the SAC-C Orbit Using the Multi-Scales Single Event Phenomena Predictive Platform (MUSCA )
G Hubert, S Duzellier, C Inguimbert, C Boatella-Polo, FÇ Bezerra, ...
IEEE Transactions on Nuclear Science 56 (6), 3032-3042, 2009
1112009
Impact of the radial ionization profile on SEE prediction for SOI transistors and SRAMs beyond the 32-nm technological node
M Raine, G Hubert, M Gaillardin, L Artola, P Paillet, S Girard, ...
IEEE Transactions on Nuclear Science 58 (3), 840-847, 2011
802011
Detailed analysis of secondary ions' effect for the calculation of neutron-induced SER in SRAMs
G Hubert, JM Palau, K Castellani-Coulie, MC Calvet, S Fourtine
IEEE Transactions on Nuclear Science 48 (6), 1953-1959, 2001
742001
Single-event transient modeling in a 65-nm bulk CMOS technology based on multi-physical approach and electrical simulations
G Hubert, L Artola
IEEE Transactions on Nuclear Science 60 (6), 4421-4429, 2013
662013
Impact of scaling on the soft error sensitivity of bulk, FDSOI and FinFET technologies due to atmospheric radiation
G Hubert, L Artola, D Regis
Integration 50, 39-47, 2015
652015
SEU prediction from SET modeling using multi-node collection in bulk transistors and SRAMs down to the 65 nm technology node
L Artola, G Hubert, KM Warren, M Gaillardin, RD Schrimpf, RA Reed, ...
IEEE Transactions on Nuclear Science 58 (3), 1338-1346, 2011
562011
Various SEU conditions in SRAM studied by 3-D device simulation
K Castellani-Coulié, JM Palau, G Hubert, MC Calvet, PE Dodd, F Sexton
IEEE Transactions on Nuclear Science 48 (6), 1931-1936, 2001
522001
Modeling single event transients in advanced devices and ICs
L Artola, M Gaillardin, G Hubert, M Raine, P Paillet
IEEE Transactions on Nuclear Science 62 (4), 1528-1539, 2015
492015
Anthology of the development of radiation transport tools as applied to single event effects
RA Reed, RA Weller, A Akkerman, J Barak, W Culpepper, S Duzellier, ...
IEEE Transactions on Nuclear Science 60 (3), 1876-1911, 2013
492013
Multiple event transient induced by nuclear reactions in CMOS logic cells
C Rusu, A Bougerol, L Anghel, C Weulerse, N Buard, S Benhammadi, ...
13th IEEE International On-Line Testing Symposium (IOLTS 2007), 137-145, 2007
432007
Continuous High-Altitude Measurements of Cosmic Ray Neutrons and SEU/MCU at Various Locations: Correlation and Analyses Based-On MUSCA SEP
G Hubert, R Velazco, C Federico, A Cheminet, C Silva-Cardenas, ...
IEEE Transactions on Nuclear Science 60 (4), 2418-2426, 2013
412013
Real-Life SEU Experiments on 90 nm SRAMs in Atmospheric Environment: Measures Versus Predictions Done by Means ofPlatform
P Peronnard, R Velazco, G Hubert
IEEE Transactions on Nuclear Science 56 (6), 3450-3455, 2009
412009
Monte Carlo prediction of heavy ion induced MBU sensitivity for SOI SRAMs using radial ionization profile
M Raine, G Hubert, M Gaillardin, P Paillet, A Bournel
IEEE Transactions on Nuclear Science 58 (6), 2607-2613, 2011
402011
ICARE on-board SAC-C: More than 8 years of SEU and MCU, analysis and prediction
C Boatella, G Hubert, R Ecoffet, S Duzellier
IEEE Transactions on Nuclear Science 57 (4), 2000-2009, 2010
372010
Analysis of quasi-monoenergetic neutron and proton SEU cross sections for terrestrial applications
D Lambert, J Baggio, G Hubert, P Paillet, S Girard, V Ferlet-Cavrois, ...
IEEE transactions on nuclear science 53 (4), 1890-1896, 2006
372006
Neutron-induced SEU in SRAMs: Simulations with n-Si and nO interactions
D Lambert, J Baggio, G Hubert, V Ferlet-Cavrois, O Flament, F Saigné, ...
IEEE transactions on nuclear science 52 (6), 2332-2339, 2005
372005
Simulation of single and multi-node collection: Impact on SEU occurrence in nanometric SRAM cells
G Toure, G Hubert, K Castellani-Coulie, S Duzellier, JM Portal
IEEE Transactions on Nuclear Science 58 (3), 862-869, 2011
352011
Study of basic mechanisms induced by an ionizing particle on simple structures
G Hubert, JM Palau, P Roche, B Sagnes, J Gasiot, MC Calvet
IEEE Transactions on Nuclear Science 47 (3), 519-526, 2000
352000
Modeling of radiation-induced single event transients in SOI FinFETS
L Artola, G Hubert, RD Schrimpf
2013 IEEE International Reliability Physics Symposium (IRPS), SE. 1.1-SE. 1.6, 2013
342013
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