Guillaume Hubert
Guillaume Hubert
ONERA, the French Aerospace Lab.
Verified email at onera.fr
Title
Cited by
Cited by
Year
Device simulation study of the SEU sensitivity of SRAMs to internal ion tracks generated by nuclear reactions
JM Palau, G Hubert, K Coulie, B Sagnes, MC Calvet, S Fourtine
IEEE Transactions on Nuclear Science 48 (2), 225-231, 2001
1182001
Operational SER Calculations on the SAC-C Orbit Using the Multi-Scales Single Event Phenomena Predictive Platform (MUSCA )
G Hubert, S Duzellier, C Inguimbert, C Boatella-Polo, FÇ Bezerra, ...
IEEE Transactions on Nuclear Science 56 (6), 3032-3042, 2009
1112009
Impact of the radial ionization profile on SEE prediction for SOI transistors and SRAMs beyond the 32-nm technological node
M Raine, G Hubert, M Gaillardin, L Artola, P Paillet, S Girard, ...
IEEE Transactions on Nuclear Science 58 (3), 840-847, 2011
802011
Detailed analysis of secondary ions' effect for the calculation of neutron-induced SER in SRAMs
G Hubert, JM Palau, K Castellani-Coulie, MC Calvet, S Fourtine
IEEE Transactions on Nuclear Science 48 (6), 1953-1959, 2001
742001
Impact of scaling on the soft error sensitivity of bulk, FDSOI and FinFET technologies due to atmospheric radiation
G Hubert, L Artola, D Regis
Integration 50, 39-47, 2015
692015
Single-event transient modeling in a 65-nm bulk CMOS technology based on multi-physical approach and electrical simulations
G Hubert, L Artola
IEEE Transactions on Nuclear Science 60 (6), 4421-4429, 2013
672013
SEU prediction from SET modeling using multi-node collection in bulk transistors and SRAMs down to the 65 nm technology node
L Artola, G Hubert, KM Warren, M Gaillardin, RD Schrimpf, RA Reed, ...
IEEE Transactions on Nuclear Science 58 (3), 1338-1346, 2011
572011
Various SEU conditions in SRAM studied by 3-D device simulation
K Castellani-Coulié, JM Palau, G Hubert, MC Calvet, PE Dodd, F Sexton
IEEE Transactions on Nuclear Science 48 (6), 1931-1936, 2001
522001
Modeling single event transients in advanced devices and ICs
L Artola, M Gaillardin, G Hubert, M Raine, P Paillet
IEEE Transactions on Nuclear Science 62 (4), 1528-1539, 2015
492015
Anthology of the development of radiation transport tools as applied to single event effects
RA Reed, RA Weller, A Akkerman, J Barak, W Culpepper, S Duzellier, ...
IEEE Transactions on Nuclear Science 60 (3), 1876-1911, 2013
492013
Multiple event transient induced by nuclear reactions in CMOS logic cells
C Rusu, A Bougerol, L Anghel, C Weulerse, N Buard, S Benhammadi, ...
13th IEEE International On-Line Testing Symposium (IOLTS 2007), 137-145, 2007
442007
Continuous High-Altitude Measurements of Cosmic Ray Neutrons and SEU/MCU at Various Locations: Correlation and Analyses Based-On MUSCA SEP
G Hubert, R Velazco, C Federico, A Cheminet, C Silva-Cardenas, ...
IEEE Transactions on Nuclear Science 60 (4), 2418-2426, 2013
412013
Real-Life SEU Experiments on 90 nm SRAMs in Atmospheric Environment: Measures Versus Predictions Done by Means ofPlatform
P Peronnard, R Velazco, G Hubert
IEEE Transactions on Nuclear Science 56 (6), 3450-3455, 2009
412009
Monte Carlo prediction of heavy ion induced MBU sensitivity for SOI SRAMs using radial ionization profile
M Raine, G Hubert, M Gaillardin, P Paillet, A Bournel
IEEE Transactions on Nuclear Science 58 (6), 2607-2613, 2011
402011
ICARE on-board SAC-C: More than 8 years of SEU and MCU, analysis and prediction
C Boatella, G Hubert, R Ecoffet, S Duzellier
IEEE Transactions on Nuclear Science 57 (4), 2000-2009, 2010
382010
Analysis of quasi-monoenergetic neutron and proton SEU cross sections for terrestrial applications
D Lambert, J Baggio, G Hubert, P Paillet, S Girard, V Ferlet-Cavrois, ...
IEEE transactions on nuclear science 53 (4), 1890-1896, 2006
372006
Neutron-induced SEU in SRAMs: Simulations with n-Si and nO interactions
D Lambert, J Baggio, G Hubert, V Ferlet-Cavrois, O Flament, F Saigné, ...
IEEE transactions on nuclear science 52 (6), 2332-2339, 2005
372005
Simulation of single and multi-node collection: Impact on SEU occurrence in nanometric SRAM cells
G Toure, G Hubert, K Castellani-Coulie, S Duzellier, JM Portal
IEEE Transactions on Nuclear Science 58 (3), 862-869, 2011
352011
Study of basic mechanisms induced by an ionizing particle on simple structures
G Hubert, JM Palau, P Roche, B Sagnes, J Gasiot, MC Calvet
IEEE Transactions on Nuclear Science 47 (3), 519-526, 2000
352000
Modeling of radiation-induced single event transients in SOI FinFETS
L Artola, G Hubert, RD Schrimpf
2013 IEEE International Reliability Physics Symposium (IRPS), SE. 1.1-SE. 1.6, 2013
342013
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