| The electromagnetic compatibility of integrated circuits—Past, present, and future M Ramdani, E Sicard, A Boyer, SB Dhia, JJ Whalen, TH Hubing, ... IEEE Transactions on Electromagnetic Compatibility 51 (1), 78-100, 2009 | 379 | 2009 |
| Electromagnetic Compatibility of Integrated Circuits: Techniques for low emission and susceptibility SB Dhia, M Ramdani, E Sicard Springer Science & Business Media, 2006 | 343 | 2006 |
| The challenge of signal integrity in deep-submicrometer CMOS technology F Caignet, S Delmas-Bendhia, E Sicard Proceedings of the IEEE 89 (4), 556-573, 2001 | 199 | 2001 |
| Basics of CMOS cell design E Sicard, S Ben Dhia (No Title), 2007 | 108 | 2007 |
| Modeling the electromagnetic emission of a microcontroller using a single model C Labussière-Dorgan, S Bendhia, E Sicard, J Tao, HJ Quaresma, ... IEEE transactions on Electromagnetic compatibility 50 (1), 22-34, 2008 | 101 | 2008 |
| Characterization of the electromagnetic susceptibility of integrated circuits using a near field scan A Boyer, SB Dhia, E Sicard Electronics Letters 43 (1), 15, 2007 | 72 | 2007 |
| Advanced CMOS cell design E Sicard, SD Bendhia (No Title), 2007 | 63 | 2007 |
| Characterization and modeling of parasitic emission in deep submicron CMOS B Vrignon, SD Bendhia, E Lamoureux, E Sicard IEEE Transactions on Electromagnetic Compatibility 47 (2), 382-387, 2005 | 61 | 2005 |
| Effective teaching of the physical design of integrated circuits using educational tools SM Aziz, E Sicard, SB Dhia IEEE Transactions on Education 53 (4), 517-531, 2009 | 53 | 2009 |
| On-chip noise sensor for integrated circuit susceptibility investigations S Dhia, A Boyer, B Vrignon, M Deobarro, TV Dinh IEEE transactions on instrumentation and measurement 61 (3), 696-707, 2011 | 45 | 2011 |
| Modeling and simulation of LDO voltage regulator susceptibility to conducted EMI J Wu, A Boyer, J Li, B Vrignon, SB Dhia, E Sicard, R Shen IEEE Transactions on Electromagnetic Compatibility 56 (3), 726-735, 2014 | 42 | 2014 |
| Microwind & Dsch: Version 3 E Sicard, SB Dhia INSA, 2004 | 42* | 2004 |
| Characterization of the evolution of IC emissions after accelerated aging A Boyer, AC Ndoye, SB Dhia, L Guillot, B Vrignon IEEE Transactions on Electromagnetic Compatibility 51 (4), 892-900, 2009 | 37 | 2009 |
| Modelling of a direct power injection aggression on a 16-bit microcontroller buffer A Boyer Proc. EMC COMPO 07, Torino, Italy, 2007 | 37 | 2007 |
| Characterisation of microcontroller susceptibility to radio frequency interference S Baffreau, S Bendhia, M Ramdani, E Sicard Proceedings of the Fourth IEEE International Caracas Conference on Devices …, 2002 | 35 | 2002 |
| On-chip sampling in CMOS integrated circuits S Delmas-Bendhia, F Caignet, E Sicard, M Roca IEEE Transactions on Electromagnetic Compatibility 41 (4), 403-406, 1999 | 35 | 1999 |
| Characterization of changes in LDO susceptibility after electrical stress J Wu, A Boyer, J Li, SB Dhia, R Shen IEEE transactions on electromagnetic compatibility 55 (5), 883-890, 2013 | 30 | 2013 |
| Towards an EMC roadmap for Integrated Circuits M Ramdani, E Sicard, SB Dhia, J Catrysse 2008 Asia-Pacific Symposium on Electromagnetic Compatibility and 19th …, 2008 | 30 | 2008 |
| Characterisation of electromagnetic compatibility drifts of nanoscale integrated circuit after accelerated life tests SB Dhia, A Boyer, B Li, AC Ndoye Electronics Letters 46 (4), 278-280, 2010 | 28 | 2010 |
| Ageing effect on electromagnetic susceptibility of a phase locked loop B Li, A Boyer, S Bendhia, C Lemoine Microelectronics Reliability 50 (9-11), 1304-1308, 2010 | 25 | 2010 |
Etienne SicardProfessor, electronics & computer engineeringAdresse e-mail validée de insa-toulouse.fr
