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Damien Faurie
Damien Faurie
LSPM - CNRS, Université Sorbonne Paris Nord
Adresse e-mail validée de univ-paris13.fr
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Study of texture effect on elastic properties of Au thin films by X-ray diffraction and in situ tensile testing
D Faurie, PO Renault, E Le Bourhis, P Goudeau
Acta Materialia 54 (17), 4503-4513, 2006
852006
Measurement of the elastic constants of textured anisotropic thin films from x-ray diffraction data
PO Renault, E Le Bourhis, P Villain, P Goudeau, KF Badawi, D Faurie
Applied Physics Letters 83 (3), 473-475, 2003
762003
Development of a synchrotron biaxial tensile device for in situ characterization of thin films mechanical response
G Geandier, D Thiaudière, RN Randriamazaoro, R Chiron, S Djaziri, ...
Review of Scientific Instruments 81 (10), 2010
562010
In situ diffraction strain analysis of elastically deformed polycrystalline thin films, and micromechanical interpretation
D Faurie, O Castelnau, R Brenner, PO Renault, E Le Bourhis, P Goudeau
Journal of Applied Crystallography 42 (6), 1073-1084, 2009
552009
Bending strain-tunable magnetic anisotropy in Co2FeAl Heusler thin film on Kapton®
M Gueye, BM Wague, F Zighem, M Belmeguenai, MS Gabor, T Petrisor, ...
Applied Physics Letters 105 (6), 2014
502014
Voltage-induced strain control of the magnetic anisotropy in a Ni thin film on flexible substrate
F Zighem, D Faurie, S Mercone, M Belmeguenai, H Haddadi
Journal of Applied Physics 114 (7), 2013
472013
Elastic anisotropy of polycrystalline Au films: Modeling and respective contributions of X-ray diffraction, nanoindentation and Brillouin light scattering
D Faurie, P Djémia, E Le Bourhis, PO Renault, Y Roussigné, SM Cherif, ...
Acta Materialia 58 (15), 4998-5008, 2010
462010
Structural and elastic properties of ternary metal nitrides TixTa1− xN alloys: First-principles calculations versus experiments
P Djemia, M Benhamida, K Bouamama, L Belliard, D Faurie, G Abadias
Surface and Coatings Technology 215, 199-208, 2013
452013
Synchrotron X-ray diffraction experiments with a prototype hybrid pixel detector
C Le Bourlot, P Landois, S Djaziri, PO Renault, E Le Bourhis, P Goudeau, ...
Journal of Applied Crystallography 45 (1), 38-47, 2012
452012
Measurement of thin film elastic constants by X-ray diffraction
D Faurie, PO Renault, E Le Bourhis, P Villain, P Goudeau, F Badawi
Thin Solid Films 469, 201-205, 2004
452004
Combined synchrotron X-ray and image-correlation analyses of biaxially deformed W/Cu nanocomposite thin films on Kapton
S Djaziri, PO Renault, F Hild, E Le Bourhis, P Goudeau, D Thiaudière, ...
Journal of Applied Crystallography 44 (5), 1071-1079, 2011
442011
Determination of elastic constants of a fiber-textured gold film by combining synchrotron x-ray diffraction and in situ tensile testing
D Faurie, PO Renault, E Le Bourhis, P Goudeau
Journal of applied physics 98 (9), 2005
372005
Elastic-strain distribution in metallic film-polymer substrate composites
G Geandier, PO Renault, E Le Bourhis, P Goudeau, D Faurie, ...
Applied Physics Letters 96 (4), 2010
35*2010
Yield surface of polycrystalline thin films as revealed by non-equibiaxial loadings at small deformation
S Djaziri, D Faurie, PO Renault, E Le Bourhis, P Goudeau, G Geandier, ...
Acta materialia 61 (13), 5067-5077, 2013
312013
Comparative study of the mechanical properties of nanostructured thin films on stretchable substrates
S Djaziri, PO Renault, E Le Bourhis, P Goudeau, D Faurie, G Geandier, ...
Journal of Applied Physics 116 (9), 2014
302014
Bulk Ni–W alloys with a composite-like microstructure processed by spark plasma sintering: Microstructure and mechanical properties
T Sadat, G Dirras, D Tingaud, M Ota, T Chauveau, D Faurie, S Vajpai, ...
Materials & Design 89, 1181-1190, 2016
262016
Laue-DIC: a new method for improved stress field measurements at the micrometer scale
J Petit, O Castelnau, M Bornert, FG Zhang, F Hofmann, AM Korsunsky, ...
Journal of Synchrotron Radiation 22 (4), 980-994, 2015
262015
In situ x-ray diffraction analysis of 2D crack patterning in thin films
D Faurie, F Zighem, P Godard, G Parry, T Sadat, D Thiaudière, ...
Acta Materialia 165, 177-182, 2019
252019
Elastic behavior of polycrystalline thin films inferred from in situ micromechanical testing and modeling
D Faurie, PO Renault, E Le Bourhis, P Goudeau, O Castelnau, R Brenner, ...
Applied physics letters 89 (6), 2006
252006
Deformation modes of nanostructured thin film under controlled biaxial deformation
S Djaziri, D Faurie, E Le Bourhis, P Goudeau, PO Renault, C Mocuta, ...
Thin Solid Films 530, 30-34, 2013
242013
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