| FOX,free objects for crystallography': a modular approach to ab initio structure determination from powder diffraction V Favre-Nicolin, R Cerny Journal of applied crystallography 35 (6), 734-743, 2002 | 1503 | 2002 |
| Resonant diffraction JL Hodeau, V Favre-Nicolin, S Bos, H Renevier, E Lorenzo, JF Berar Chemical reviews 101 (6), 1843-1868, 2001 | 225 | 2001 |
| Synthesis, crystal structure and hydrogenation properties of the ternary compounds LaNi4Mg and NdNi4Mg L Guénée, V Favre-Nicolin, K Yvon Journal of alloys and compounds 348 (1-2), 129-137, 2003 | 154 | 2003 |
| A better FOX: using flexible modelling and maximum likelihood to improve direct-space ab initio structure determination from powder diffraction V Favre-Nicolin, R Černý Zeitschrift für Kristallographie-Crystalline Materials 219 (12), 847-856, 2004 | 149 | 2004 |
| Direct space methods of structure determination from powder diffraction: principles, guidelines and perspectives R Černý, V Favre-Nicolin Zeitschrift für Kristallographie-Crystalline Materials 222 (3-4), 105-113, 2007 | 135 | 2007 |
| Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging V Favre-Nicolin, F Mastropietro, J Eymery, D Camacho, YM Niquet, ... New Journal of Physics 12 (3), 035013, 2010 | 89 | 2010 |
| Elastic strain relaxation in GaN/AlN nanowire superlattice O Landré, D Camacho, C Bougerol, YM Niquet, V Favre-Nicolin, ... Physical Review B 81 (15), 153306, 2010 | 70 | 2010 |
| Strain, size, and composition of InAs quantum sticks embedded in InP determined via grazing incidence X-ray anomalous diffraction A Létoublon, V Favre-Nicolin, H Renevier, MG Proietti, C Monat, ... Physical review letters 92 (18), 186101, 2004 | 65 | 2004 |
| The Nanodiffraction beamline ID01/ESRF: a microscope for imaging strain and structure SJ Leake, GA Chahine, H Djazouli, T Zhou, C Richter, J Hilhorst, L Petit, ... Journal of synchrotron radiation 26 (2), 571-584, 2019 | 64 | 2019 |
| PyNX: high-performance computing toolkit for coherent X-ray imaging based on operators V Favre-Nicolin, G Girard, S Leake, J Carnis, Y Chushkin, J Kieffer, ... Journal of Applied Crystallography 53 (5), 1404-1413, 2020 | 51 | 2020 |
| FOX: Modular approach to crystal structure determination from powder diffraction V Favre-Nicolin, R Černý Materials Science Forum 443, 35-38, 2004 | 51 | 2004 |
| PyNX. Ptycho: a computing library for X-ray coherent diffraction imaging of nanostructures O Mandula, M Elzo Aizarna, J Eymery, M Burghammer, V Favre-Nicolin Journal of Applied Crystallography 49 (5), 1842-1848, 2016 | 49 | 2016 |
| Fast computation of scattering maps of nanostructures using graphical processing units V Favre-Nicolin, J Coraux, MI Richard, H Renevier Journal of Applied Crystallography 44 (3), 635-640, 2011 | 42 | 2011 |
| Spontaneous compliance of the InP∕ SrTiO3 heterointerface G Saint-Girons, C Priester, P Regreny, G Patriarche, L Largeau, ... Applied Physics Letters 92 (24), 2008 | 41 | 2008 |
| Coherent x-ray wavefront reconstruction of a partially illuminated Fresnel zone plate F Mastropietro, D Carbone, A Diaz, J Eymery, A Sentenac, TH Metzger, ... Optics express 19 (20), 19223-19232, 2011 | 40 | 2011 |
| FOX: A friendly tool to solve nonmolecular structures from powder diffraction R Černý, V Favre-Nicolin Powder Diffraction 20 (4), 359-365, 2005 | 39 | 2005 |
| Strain relaxation and critical thickness for epitaxial LaAlO3 thin films grown on SrTiO3 (0 0 1) substrates by molecular beam epitaxy C Merckling, M El-Kazzi, G Delhaye, V Favre-Nicolin, Y Robach, ... Journal of crystal growth 306 (1), 47-51, 2007 | 38 | 2007 |
| In situ resonant x-ray study of vertical correlation and capping effects during GaN∕ AlN quantum dot growth J Coraux, H Renevier, V Favre-Nicolin, G Renaud, B Daudin Applied physics letters 88 (15), 2006 | 37 | 2006 |
| Coherent-diffraction imaging of single nanowires of diameter 95 nanometers V Favre-Nicolin, J Eymery, R Koester, P Gentile Physical Review B 79 (19), 195401, 2009 | 36 | 2009 |
| Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures: MAD and DAFS for studying … V Favre-Nicolin, MG Proietti, C Leclere, NA Katcho, MI Richard, ... The European Physical Journal Special Topics 208, 189-216, 2012 | 35 | 2012 |
Marie-Ingrid RichardCEA-Grenoble and ESRFVerified email at esrf.fr
